{"title":"使用LISN仿真和CISPR 16电压探头进行替代发射测量","authors":"O. Sen, S. Cakir, S. Acak, M. Çetintaş","doi":"10.1109/ISEMC.2015.7256348","DOIUrl":null,"url":null,"abstract":"Conducted emission tests are always performed by the use of LISNs in laboratories in accordance with CISPR22, CISPR11 and other similar standards. However, it is not always possible to use LISNs because of some limitations. If the Equipment Under Test (EUT) has large dimensions or high currents, it is not, for most of the time, possible to send it to an EMC laboratory or to use LISNs during the test. As a consequence, usage or development of alternative conducted emission test methods are inevitable in industry. In this paper, we investigated the use of LISN simulations constructed with long ordinary cables, capacitors and resistors instead of actual LISNs. In addition, we also improved the usage of CISPR16 Voltage Probe by combining it with impedance measurements of EUT, supply and used cables.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"26 8","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Alternative conducted emission measurements with LISN simulation & CISPR 16 Voltage Probe\",\"authors\":\"O. Sen, S. Cakir, S. Acak, M. Çetintaş\",\"doi\":\"10.1109/ISEMC.2015.7256348\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Conducted emission tests are always performed by the use of LISNs in laboratories in accordance with CISPR22, CISPR11 and other similar standards. However, it is not always possible to use LISNs because of some limitations. If the Equipment Under Test (EUT) has large dimensions or high currents, it is not, for most of the time, possible to send it to an EMC laboratory or to use LISNs during the test. As a consequence, usage or development of alternative conducted emission test methods are inevitable in industry. In this paper, we investigated the use of LISN simulations constructed with long ordinary cables, capacitors and resistors instead of actual LISNs. In addition, we also improved the usage of CISPR16 Voltage Probe by combining it with impedance measurements of EUT, supply and used cables.\",\"PeriodicalId\":412708,\"journal\":{\"name\":\"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)\",\"volume\":\"26 8\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-09-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.2015.7256348\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2015.7256348","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Alternative conducted emission measurements with LISN simulation & CISPR 16 Voltage Probe
Conducted emission tests are always performed by the use of LISNs in laboratories in accordance with CISPR22, CISPR11 and other similar standards. However, it is not always possible to use LISNs because of some limitations. If the Equipment Under Test (EUT) has large dimensions or high currents, it is not, for most of the time, possible to send it to an EMC laboratory or to use LISNs during the test. As a consequence, usage or development of alternative conducted emission test methods are inevitable in industry. In this paper, we investigated the use of LISN simulations constructed with long ordinary cables, capacitors and resistors instead of actual LISNs. In addition, we also improved the usage of CISPR16 Voltage Probe by combining it with impedance measurements of EUT, supply and used cables.