{"title":"基于时域微波波形测量的传统晶体管非线性模型提取/验证","authors":"P. Tasker","doi":"10.1109/ARFTG.2001.327500","DOIUrl":null,"url":null,"abstract":"Integration of an NLVNA measurement system with appropriate arbitrary waveform voltage stimuli hardware provides for large signal measurements that can be used to both verify and extract conventional transistor non-linear models. As a verification tool, they can be used not only to quantify model accuracy but also to aid directly in identifying model problems and deficiencies. In model generation they can be used as a replacement for bias dependent small signal s-parameters during model extraction/optimisation. Alternatively, if properly selected these voltage stimuli can be transformed directly into the required state-functions.","PeriodicalId":331830,"journal":{"name":"58th ARFTG Conference Digest","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2001-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Conventional Transistor Non-Linear Model Extraction/Verification using Time Domain Microwave Waveform Measurements\",\"authors\":\"P. Tasker\",\"doi\":\"10.1109/ARFTG.2001.327500\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Integration of an NLVNA measurement system with appropriate arbitrary waveform voltage stimuli hardware provides for large signal measurements that can be used to both verify and extract conventional transistor non-linear models. As a verification tool, they can be used not only to quantify model accuracy but also to aid directly in identifying model problems and deficiencies. In model generation they can be used as a replacement for bias dependent small signal s-parameters during model extraction/optimisation. Alternatively, if properly selected these voltage stimuli can be transformed directly into the required state-functions.\",\"PeriodicalId\":331830,\"journal\":{\"name\":\"58th ARFTG Conference Digest\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"58th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2001.327500\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"58th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2001.327500","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Conventional Transistor Non-Linear Model Extraction/Verification using Time Domain Microwave Waveform Measurements
Integration of an NLVNA measurement system with appropriate arbitrary waveform voltage stimuli hardware provides for large signal measurements that can be used to both verify and extract conventional transistor non-linear models. As a verification tool, they can be used not only to quantify model accuracy but also to aid directly in identifying model problems and deficiencies. In model generation they can be used as a replacement for bias dependent small signal s-parameters during model extraction/optimisation. Alternatively, if properly selected these voltage stimuli can be transformed directly into the required state-functions.