G. Andria, A. Di Nisio, V. Scarano, M. Spadavecchia, M. Bregoli, M. Franceschi, Nicola Tavernini
{"title":"一种用于航空航天的新型光耦合器的加速寿命试验","authors":"G. Andria, A. Di Nisio, V. Scarano, M. Spadavecchia, M. Bregoli, M. Franceschi, Nicola Tavernini","doi":"10.1109/METROAEROSPACE.2014.6865978","DOIUrl":null,"url":null,"abstract":"The research activity presented in this paper deals with accelerated reliability tests on a new electronic device, which is an optocoupler designed and manufactured in Italy for aerospace application. In the paper a complete approach for the experimental evaluation of the device reliability performance is proposed. A reliability test plan was designed and implemented, considering the application of different thermal severities (maximum and minimum temperatures, dwell time and thermal rate). The description of the new device, the test plan and its implementation as well as preliminary results will be presented.","PeriodicalId":162403,"journal":{"name":"2014 IEEE Metrology for Aerospace (MetroAeroSpace)","volume":"36 20","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Accelerated life tests of a new optocoupler for aerospace application\",\"authors\":\"G. Andria, A. Di Nisio, V. Scarano, M. Spadavecchia, M. Bregoli, M. Franceschi, Nicola Tavernini\",\"doi\":\"10.1109/METROAEROSPACE.2014.6865978\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The research activity presented in this paper deals with accelerated reliability tests on a new electronic device, which is an optocoupler designed and manufactured in Italy for aerospace application. In the paper a complete approach for the experimental evaluation of the device reliability performance is proposed. A reliability test plan was designed and implemented, considering the application of different thermal severities (maximum and minimum temperatures, dwell time and thermal rate). The description of the new device, the test plan and its implementation as well as preliminary results will be presented.\",\"PeriodicalId\":162403,\"journal\":{\"name\":\"2014 IEEE Metrology for Aerospace (MetroAeroSpace)\",\"volume\":\"36 20\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-05-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 IEEE Metrology for Aerospace (MetroAeroSpace)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/METROAEROSPACE.2014.6865978\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE Metrology for Aerospace (MetroAeroSpace)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/METROAEROSPACE.2014.6865978","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Accelerated life tests of a new optocoupler for aerospace application
The research activity presented in this paper deals with accelerated reliability tests on a new electronic device, which is an optocoupler designed and manufactured in Italy for aerospace application. In the paper a complete approach for the experimental evaluation of the device reliability performance is proposed. A reliability test plan was designed and implemented, considering the application of different thermal severities (maximum and minimum temperatures, dwell time and thermal rate). The description of the new device, the test plan and its implementation as well as preliminary results will be presented.
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