氮化镓场效应管与硅MOSFET的性能比较

Shima Khoshzaman, I. Hahn
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引用次数: 5

摘要

氮化镓(GaN)等宽禁带半导体在功率器件结构中的优异优势,为电力电子学的新时代奠定了新的起点。以氮化镓为基础的功率器件取代硅基功率器件有望带来许多好处。更高的功率密度、开关速度和温度稳定性、更低的导通和开关损耗以及更小的芯片尺寸是GaN晶体管提供的一些性能改进。为了展示这种新技术的优势和挑战,解释了硅基和氮化镓基晶体管之间的合格比较方法。对100 V市售的增强模式GaN场效应管和两个硅基mosfet进行了实验比较,并对结果进行了详细的讨论。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Performance Comparison of GaN FET and Silicon MOSFET
Introducing the excellent advantages of using wide bandgap semiconductors such as gallium nitride (GaN) in the construction of the power devices has set a starting point for a new era in the history of power electronics. Replacing the silicon-based with GaN-based power devices promises a number of benefits. Higher power densities, switching speeds and temperature stabilities with lower on-state resistance, reduced conduction and switching losses and a reduction in the die size are some of the performance improvements that the GaN transistors offer. To show both the advantages and challenges regarding this new technology, the methodology for an eligible comparison between Si-based and GaN-based transistors has been explained. Experimental comparison has been performed between a 100 V commercially available enhancement mode GaN FET and two silicon-based MOSFETs, and the results are discussed in detail.
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