{"title":"CMOS RF:不再是一个矛盾修饰法","authors":"T. Lee","doi":"10.1109/GAAS.1997.628279","DOIUrl":null,"url":null,"abstract":"Peak CMOS f/sub T/'s are now in excess of 30 GHz and double every three years. That raw device speed is supplemented by recently developed passive elements, such as the lateral flux capacitor and the shielded spiral inductor, in which the lossy substrate is made much less relevant without requiring special processing steps. Device F/sub min/ is typically under 0.5 dB at 1-2 GHz, and a better understanding of broadband MOSFET noise has shown how to minimize amplifier noise figure within a specified power budget. Finally, a new understanding of phase noise has shown that satisfaction of previously unappreciated symmetry criteria can suppress greatly (e.g., by factors of 5-10 or more) the upconversion of 1/f device noise into close-in phase noise.","PeriodicalId":299287,"journal":{"name":"GaAs IC Symposium. IEEE Gallium Arsenide Integrated Circuit Symposium. 19th Annual Technical Digest 1997","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-10-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"31","resultStr":"{\"title\":\"CMOS RF: no longer an oxymoron\",\"authors\":\"T. Lee\",\"doi\":\"10.1109/GAAS.1997.628279\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Peak CMOS f/sub T/'s are now in excess of 30 GHz and double every three years. That raw device speed is supplemented by recently developed passive elements, such as the lateral flux capacitor and the shielded spiral inductor, in which the lossy substrate is made much less relevant without requiring special processing steps. Device F/sub min/ is typically under 0.5 dB at 1-2 GHz, and a better understanding of broadband MOSFET noise has shown how to minimize amplifier noise figure within a specified power budget. Finally, a new understanding of phase noise has shown that satisfaction of previously unappreciated symmetry criteria can suppress greatly (e.g., by factors of 5-10 or more) the upconversion of 1/f device noise into close-in phase noise.\",\"PeriodicalId\":299287,\"journal\":{\"name\":\"GaAs IC Symposium. IEEE Gallium Arsenide Integrated Circuit Symposium. 19th Annual Technical Digest 1997\",\"volume\":\"28 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-10-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"31\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"GaAs IC Symposium. IEEE Gallium Arsenide Integrated Circuit Symposium. 19th Annual Technical Digest 1997\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/GAAS.1997.628279\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"GaAs IC Symposium. IEEE Gallium Arsenide Integrated Circuit Symposium. 19th Annual Technical Digest 1997","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GAAS.1997.628279","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Peak CMOS f/sub T/'s are now in excess of 30 GHz and double every three years. That raw device speed is supplemented by recently developed passive elements, such as the lateral flux capacitor and the shielded spiral inductor, in which the lossy substrate is made much less relevant without requiring special processing steps. Device F/sub min/ is typically under 0.5 dB at 1-2 GHz, and a better understanding of broadband MOSFET noise has shown how to minimize amplifier noise figure within a specified power budget. Finally, a new understanding of phase noise has shown that satisfaction of previously unappreciated symmetry criteria can suppress greatly (e.g., by factors of 5-10 or more) the upconversion of 1/f device noise into close-in phase noise.