新型300mm RFSOI器件dc - 40ghz DPDT开关矩阵设计

Boa-Hua Yu, Kaixue Ma, F. Meng, K. Yeo, Ting Guo, J. Wong, Alfred Chong
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引用次数: 1

摘要

本文提出了一种低插入损耗、高隔离、超宽带双极双掷(DPDT)开关矩阵,该开关矩阵采用新颖的器件结构设计在商用0.13\ \mu\mathrm{m}$高电阻率富陷阱SOI上。该开关采用串联-并联-串联配置,采用环形输入输出匹配网络。所设计的开关实现了从直流到40 GHz的最宽带宽,插入损耗低于3 dB,隔离度高达34 dB,最高可达40 GHz。高性能DPDT开关是通过选择性SOI顶硅减薄制备的。结果表明,SOI顶部硅凹槽能显著改善DPDT开关的插入损耗。所设计的$2\ × 2$开关矩阵的有源芯片面积仅为$0.28 \text{mm}\ × 0.21\ text{mm}$。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
DC-40 GHz DPDT Switch Matrix Design with Novel Device in 300mm RFSOI
This paper presents low insertion loss, high isolation, ultra wideband double-pole-double-throw (DPDT) switch matrix designed with novel device structures in a commercial $0.13\ \mu\mathrm{m}$ high resistivity trap-rich SOI. The switches are designed using series-shunt-series configuration in a ring-type with input and output matching networks. The designed switches achieve widest bandwidth from DC to 40 GHz with a low insertion loss of less than 3 dB and a high isolation of 34 dB up to 40 GHz. The high performance DPDT switch is fabricated via selective SOI top silicon thinning. It was found SOI top silicon recess can significantly improve the DPDT switch insertion loss. The active chip area of designed $2\times 2$ switch matrix is only $0.28 \text{mm}\times 0.21\ \text{mm}$.
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