用于低功耗应用的FinFET 12t SRAM单元的设计与实现

Pavankumar Bikki, Anuvala Setty Vlp, Sai Poojitha, rd Akula, N. Sree, Linaa Chowdary
{"title":"用于低功耗应用的FinFET 12t SRAM单元的设计与实现","authors":"Pavankumar Bikki, Anuvala Setty Vlp, Sai Poojitha, rd Akula, N. Sree, Linaa Chowdary","doi":"10.1109/CONIT59222.2023.10205733","DOIUrl":null,"url":null,"abstract":"The technology is advancing in low-power applications, and leakage power is the most obvious issue for memories like SRAM cells. Since they have low power dissipation and high consistency requirements, SRAM cells are a crucial component of modern SoCs, portable electronics, and microprocessors. This paper examined the pros and cons of the various SRAM cell architectures used in FinFET. A novel 14 nm FinFET 12T SRAM cell for low leakage power and high stability has been proposed. The proposed design is compared to a CMOS 12T SRAM cell with the technology of 90 nm and 45 nm. We also investigated the leakage power, total power, temperature variations, and SNM. The proposed design attained a low leakage power of 95.1 pw and total power dissipation of 1.69 nW as compared to the 12T CMOS designs. However, the proposed cell achieves a higher SNM when compared to SRAM using CMOS. This proves that the proposed design is stable to accommodate low-power applications.","PeriodicalId":377623,"journal":{"name":"2023 3rd International Conference on Intelligent Technologies (CONIT)","volume":" 20","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-06-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Design and Implementation of FinFET 12-T SRAM cell for low power Applications\",\"authors\":\"Pavankumar Bikki, Anuvala Setty Vlp, Sai Poojitha, rd Akula, N. Sree, Linaa Chowdary\",\"doi\":\"10.1109/CONIT59222.2023.10205733\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The technology is advancing in low-power applications, and leakage power is the most obvious issue for memories like SRAM cells. Since they have low power dissipation and high consistency requirements, SRAM cells are a crucial component of modern SoCs, portable electronics, and microprocessors. This paper examined the pros and cons of the various SRAM cell architectures used in FinFET. A novel 14 nm FinFET 12T SRAM cell for low leakage power and high stability has been proposed. The proposed design is compared to a CMOS 12T SRAM cell with the technology of 90 nm and 45 nm. We also investigated the leakage power, total power, temperature variations, and SNM. The proposed design attained a low leakage power of 95.1 pw and total power dissipation of 1.69 nW as compared to the 12T CMOS designs. However, the proposed cell achieves a higher SNM when compared to SRAM using CMOS. This proves that the proposed design is stable to accommodate low-power applications.\",\"PeriodicalId\":377623,\"journal\":{\"name\":\"2023 3rd International Conference on Intelligent Technologies (CONIT)\",\"volume\":\" 20\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-06-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 3rd International Conference on Intelligent Technologies (CONIT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CONIT59222.2023.10205733\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 3rd International Conference on Intelligent Technologies (CONIT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CONIT59222.2023.10205733","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

该技术在低功耗应用中不断进步,泄漏功率是SRAM单元等存储器最明显的问题。由于SRAM具有低功耗和高一致性要求,因此SRAM单元是现代soc,便携式电子设备和微处理器的重要组成部分。本文研究了用于FinFET的各种SRAM单元结构的优缺点。提出了一种具有低漏功率和高稳定性的新型14nm FinFET 12T SRAM单元。并将该设计与90 nm和45 nm工艺的CMOS 12T SRAM单元进行了比较。我们还研究了泄漏功率、总功率、温度变化和SNM。与12T CMOS设计相比,该设计的漏功率为95.1 pw,总功耗为1.69 nW。然而,与使用CMOS的SRAM相比,所提出的单元实现了更高的SNM。这证明了所提出的设计是稳定的,以适应低功耗应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design and Implementation of FinFET 12-T SRAM cell for low power Applications
The technology is advancing in low-power applications, and leakage power is the most obvious issue for memories like SRAM cells. Since they have low power dissipation and high consistency requirements, SRAM cells are a crucial component of modern SoCs, portable electronics, and microprocessors. This paper examined the pros and cons of the various SRAM cell architectures used in FinFET. A novel 14 nm FinFET 12T SRAM cell for low leakage power and high stability has been proposed. The proposed design is compared to a CMOS 12T SRAM cell with the technology of 90 nm and 45 nm. We also investigated the leakage power, total power, temperature variations, and SNM. The proposed design attained a low leakage power of 95.1 pw and total power dissipation of 1.69 nW as compared to the 12T CMOS designs. However, the proposed cell achieves a higher SNM when compared to SRAM using CMOS. This proves that the proposed design is stable to accommodate low-power applications.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信