用原位透射电子显微镜研究单个纳米管的场发射

2006 19th International Vacuum Nanoelectronics Conference Pub Date : 2006-07-01 DOI:10.1109/IVNC.2006.335356

X. Bai, Zhi Xu, E. Wang

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摘要

利用透射电子显微镜研究了单壁碳纳米管的场发射特性。建立了场发射与发射极结构和发射极尖端实际功函数之间的直接联系。结果是根据Fowler-Nordheim方程建模的

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Field emission of individual nanotubes studied by in situ transmission electron microscopy

The field emission of individual multiwalled carbon nanotubes is studied using transmission electron microscope (TEM). A direct link between field emission and emitter structure and real work function at emitter tip is established. The result is modeled according to the Fowler-Nordheim equation

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2006 19th International Vacuum Nanoelectronics Conference

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