{"title":"透射电子显微镜与分析技术概述","authors":"Gyeungho Kim","doi":"10.3938/phit.32.019","DOIUrl":null,"url":null,"abstract":"Transmission electron microscopy (TEM) and related analytical techniques play crucial role in advancing nanotechnology by providing atomic scale images with simultaneous structural and chemical information originating from multitude of interactions between high energy electrons and atoms of interest. In this short review, various aspects of TEM are explained, from instrumentation, operating principles, typical application examples to recent developments in resolution improvements and performances.","PeriodicalId":365688,"journal":{"name":"Physics and High Technology","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2023-08-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Overview of Transmission Electron Microscopy and Analytical Techniques\",\"authors\":\"Gyeungho Kim\",\"doi\":\"10.3938/phit.32.019\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Transmission electron microscopy (TEM) and related analytical techniques play crucial role in advancing nanotechnology by providing atomic scale images with simultaneous structural and chemical information originating from multitude of interactions between high energy electrons and atoms of interest. In this short review, various aspects of TEM are explained, from instrumentation, operating principles, typical application examples to recent developments in resolution improvements and performances.\",\"PeriodicalId\":365688,\"journal\":{\"name\":\"Physics and High Technology\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-08-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Physics and High Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.3938/phit.32.019\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Physics and High Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3938/phit.32.019","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Overview of Transmission Electron Microscopy and Analytical Techniques
Transmission electron microscopy (TEM) and related analytical techniques play crucial role in advancing nanotechnology by providing atomic scale images with simultaneous structural and chemical information originating from multitude of interactions between high energy electrons and atoms of interest. In this short review, various aspects of TEM are explained, from instrumentation, operating principles, typical application examples to recent developments in resolution improvements and performances.
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