超大规模集成电路器件的硅晶体生长和外延层沉积

W. Davis, Robert J. Lavigna, D. L. Rehrig, Raymond E. Reusser, George Williams
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引用次数: 1

摘要

用于微电子器件的硅是通过一个复杂的过程制备的,该过程将多晶材料转化为重达40公斤的单晶硅锭。晶体必须符合精确的机械、电气、化学和晶体学标准。晶锭被切成晶圆,晶圆被抛光并覆盖有与晶圆具有相同晶体结构但电性能不同的外延层。了解和控制生产单晶铸锭和外延层的生长过程对于制造当今超大规模集成电路的高质量起始材料至关重要。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Silicon crystal growth and epitaxial layer deposition for VLSI devices
Silicon for microelectronic devices is prepared by a complex process that converts polycrystalline material into a single crystal ingot of silicon weighing as much as 40 kilograms. The crystal must conform to precise mechanical, electrical, chemical, and crystallographic standards. The crystal ingot is sliced into wafers which are polished and covered with an epitaxial layer having the same crystal structure as the wafer but different electrical properties. Understanding and controlling the growth processes involved in producing the single-crystal ingot and the epitaxial layer is crucial to manufacturing the high-quality starting material for today's very large scale integrated circuits.
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