{"title":"直接相位传感干涉测量法","authors":"Steven W. Damron","doi":"10.1364/oft.1987.thbb9","DOIUrl":null,"url":null,"abstract":"Many new optical test systems require the reduction of moderately aspheric fringe information. Often it is very difficult to evaluate these interferograms using fringe intersection data. In addition, testing environments such as vacuum chambers or large optical test configurations frequently can not be isolated from vibration.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"126 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Direct Phase Sensing Interferometry\",\"authors\":\"Steven W. Damron\",\"doi\":\"10.1364/oft.1987.thbb9\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Many new optical test systems require the reduction of moderately aspheric fringe information. Often it is very difficult to evaluate these interferograms using fringe intersection data. In addition, testing environments such as vacuum chambers or large optical test configurations frequently can not be isolated from vibration.\",\"PeriodicalId\":170034,\"journal\":{\"name\":\"Workshop on Optical Fabrication and Testing\",\"volume\":\"126 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Workshop on Optical Fabrication and Testing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/oft.1987.thbb9\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Workshop on Optical Fabrication and Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/oft.1987.thbb9","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Many new optical test systems require the reduction of moderately aspheric fringe information. Often it is very difficult to evaluate these interferograms using fringe intersection data. In addition, testing environments such as vacuum chambers or large optical test configurations frequently can not be isolated from vibration.
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