{"title":"芳纶材料热老化性能评价的新方法","authors":"S. A. Filliben","doi":"10.1109/EIC.2011.5996196","DOIUrl":null,"url":null,"abstract":"A new test method has been developed to understand the performance of aramid paper in contact with copper. Basic property tests might suggest products in the same chemical family would deliver equivalent performance. This thermal degradation testing method can be used to quantify performance differences between products and allow the designer to select the proper product for the application.","PeriodicalId":129127,"journal":{"name":"2011 Electrical Insulation Conference (EIC).","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"New test method to evaluate the thermal aging of aramid materials\",\"authors\":\"S. A. Filliben\",\"doi\":\"10.1109/EIC.2011.5996196\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new test method has been developed to understand the performance of aramid paper in contact with copper. Basic property tests might suggest products in the same chemical family would deliver equivalent performance. This thermal degradation testing method can be used to quantify performance differences between products and allow the designer to select the proper product for the application.\",\"PeriodicalId\":129127,\"journal\":{\"name\":\"2011 Electrical Insulation Conference (EIC).\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-06-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 Electrical Insulation Conference (EIC).\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EIC.2011.5996196\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 Electrical Insulation Conference (EIC).","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EIC.2011.5996196","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
New test method to evaluate the thermal aging of aramid materials
A new test method has been developed to understand the performance of aramid paper in contact with copper. Basic property tests might suggest products in the same chemical family would deliver equivalent performance. This thermal degradation testing method can be used to quantify performance differences between products and allow the designer to select the proper product for the application.