{"title":"WCDMA信号中误差矢量幅度(EVM)的可跟踪测量","authors":"D. Humphreys, R. T. Dickerson","doi":"10.1109/WDDC.2007.4339424","DOIUrl":null,"url":null,"abstract":"This is the first report of a methodology to provide national standards traceability for EVM measurement of WCDMA RF sources using waveform metrology techniques. The method uses sampling oscilloscopes or real-time digital oscilloscopes. Preliminary results indicate that the rms uncertainty of the modulation waveform, at 95% confidence, is less than 0.3 %.","PeriodicalId":142822,"journal":{"name":"2007 International Waveform Diversity and Design Conference","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2007-06-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"26","resultStr":"{\"title\":\"Traceable measurement of Error Vector Magnitude (EVM) in WCDMA signals\",\"authors\":\"D. Humphreys, R. T. Dickerson\",\"doi\":\"10.1109/WDDC.2007.4339424\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This is the first report of a methodology to provide national standards traceability for EVM measurement of WCDMA RF sources using waveform metrology techniques. The method uses sampling oscilloscopes or real-time digital oscilloscopes. Preliminary results indicate that the rms uncertainty of the modulation waveform, at 95% confidence, is less than 0.3 %.\",\"PeriodicalId\":142822,\"journal\":{\"name\":\"2007 International Waveform Diversity and Design Conference\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-06-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"26\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 International Waveform Diversity and Design Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/WDDC.2007.4339424\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 International Waveform Diversity and Design Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WDDC.2007.4339424","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Traceable measurement of Error Vector Magnitude (EVM) in WCDMA signals
This is the first report of a methodology to provide national standards traceability for EVM measurement of WCDMA RF sources using waveform metrology techniques. The method uses sampling oscilloscopes or real-time digital oscilloscopes. Preliminary results indicate that the rms uncertainty of the modulation waveform, at 95% confidence, is less than 0.3 %.
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