二元向量不相似测度的三边不等式的发现

Proceedings of the 17th International Conference on Pattern Recognition, 2004. ICPR 2004. Pub Date : 2004-08-23 DOI:10.1109/ICPR.2004.1333861

Bin Zhang, S. Srihari

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引用次数: 7

摘要

在使用一些距离度量的特定空间中，任意两个距离的和总是大于第三个距离的和。这种特殊的性质称为三边不等式(TEI)。本文对几种二元距离测度的三边不等式进行了数学证明和实验验证，并讨论了TEI的意义。

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Discovery of the tri-edge inequality with binary vector dissimilarity measures

In certain spaces using some distance measures, the sum of any two distances is always bigger than the third one. Such a special property is called the tri-edge inequality (TEI). In this paper, the tri-edge inequality characterizing several binary distance measures is mathematically proven and experimentally verified, and the implications of TEI are discussed as well.

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Proceedings of the 17th International Conference on Pattern Recognition, 2004. ICPR 2004.

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