{"title":"国外微电路和半导体工业质量等级在航天仪器(航天设计)塑料封装中的应用条件和标准","authors":"Yu. L. Nurov","doi":"10.17238/ISSN2409-0239.2015.4.92","DOIUrl":null,"url":null,"abstract":"The article considers necessary action on using foreign microcircuits industrial quality levels in plastic packages ( PEM ) for space devises. It describes PEMs positive and negative features in compare with hermetic microcircuits. Here you will find the PEMs routing in the RTC SE including 100% incoming inspection, screening testing diagnostic nondestructive testing, sepling destructive physical analyses and the certification testing. The article considers an approach to the definition of reliability performances of PEMs lot going through the combination of comprehensive tests.","PeriodicalId":436954,"journal":{"name":"Rocket-Space Device Engineering and Information Systems","volume":"117 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Application Condition and Criteria of Foreign Microcircuits and Semiconductors Industrial Quality Levels in Plastic Packages in Space Instrument-Making (Space Devises)\",\"authors\":\"Yu. L. Nurov\",\"doi\":\"10.17238/ISSN2409-0239.2015.4.92\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The article considers necessary action on using foreign microcircuits industrial quality levels in plastic packages ( PEM ) for space devises. It describes PEMs positive and negative features in compare with hermetic microcircuits. Here you will find the PEMs routing in the RTC SE including 100% incoming inspection, screening testing diagnostic nondestructive testing, sepling destructive physical analyses and the certification testing. The article considers an approach to the definition of reliability performances of PEMs lot going through the combination of comprehensive tests.\",\"PeriodicalId\":436954,\"journal\":{\"name\":\"Rocket-Space Device Engineering and Information Systems\",\"volume\":\"117 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Rocket-Space Device Engineering and Information Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.17238/ISSN2409-0239.2015.4.92\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Rocket-Space Device Engineering and Information Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.17238/ISSN2409-0239.2015.4.92","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Application Condition and Criteria of Foreign Microcircuits and Semiconductors Industrial Quality Levels in Plastic Packages in Space Instrument-Making (Space Devises)
The article considers necessary action on using foreign microcircuits industrial quality levels in plastic packages ( PEM ) for space devises. It describes PEMs positive and negative features in compare with hermetic microcircuits. Here you will find the PEMs routing in the RTC SE including 100% incoming inspection, screening testing diagnostic nondestructive testing, sepling destructive physical analyses and the certification testing. The article considers an approach to the definition of reliability performances of PEMs lot going through the combination of comprehensive tests.
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