CoNbZr-Sm2O3颗粒膜的结构和磁性能

INTERMAG 2006 - IEEE International Magnetics Conference Pub Date : 2006-05-08 DOI:10.1109/INTMAG.2006.374870

W. Jung, C. Lee, B. Koo, K. Shin, J. Yoo, Y. Shimada

{"title":"CoNbZr-Sm2O3颗粒膜的结构和磁性能","authors":"W. Jung, C. Lee, B. Koo, K. Shin, J. Yoo, Y. Shimada","doi":"10.1109/INTMAG.2006.374870","DOIUrl":null,"url":null,"abstract":"In this study, granular films were prepared by reactive RF magnetron sputtering. The film was deposited on Si (100) substrates. The magnetic properties (coercivity) were measured by a vibrating sample magnetometer (VSM). The electrical resistivity (p) of the thin film was determined by means of a four-point probe method. The film structures were investigated by X-ray diffractometry (XRD) and transmission electron microscopy (TEM).","PeriodicalId":262607,"journal":{"name":"INTERMAG 2006 - IEEE International Magnetics Conference","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-05-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"The Structure and Magnetic Properties of CoNbZr-Sm2O3 Granular Films\",\"authors\":\"W. Jung, C. Lee, B. Koo, K. Shin, J. Yoo, Y. Shimada\",\"doi\":\"10.1109/INTMAG.2006.374870\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this study, granular films were prepared by reactive RF magnetron sputtering. The film was deposited on Si (100) substrates. The magnetic properties (coercivity) were measured by a vibrating sample magnetometer (VSM). The electrical resistivity (p) of the thin film was determined by means of a four-point probe method. The film structures were investigated by X-ray diffractometry (XRD) and transmission electron microscopy (TEM).\",\"PeriodicalId\":262607,\"journal\":{\"name\":\"INTERMAG 2006 - IEEE International Magnetics Conference\",\"volume\":\"41 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-05-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"INTERMAG 2006 - IEEE International Magnetics Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/INTMAG.2006.374870\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"INTERMAG 2006 - IEEE International Magnetics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INTMAG.2006.374870","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

本研究采用反应式射频磁控溅射法制备了颗粒状薄膜。薄膜沉积在Si(100)衬底上。用振动样品磁强计(VSM)测量了材料的磁性能(矫顽力)。用四点探针法测定了薄膜的电阻率。采用x射线衍射仪(XRD)和透射电镜(TEM)对膜的结构进行了研究。

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The Structure and Magnetic Properties of CoNbZr-Sm2O3 Granular Films

In this study, granular films were prepared by reactive RF magnetron sputtering. The film was deposited on Si (100) substrates. The magnetic properties (coercivity) were measured by a vibrating sample magnetometer (VSM). The electrical resistivity (p) of the thin film was determined by means of a four-point probe method. The film structures were investigated by X-ray diffractometry (XRD) and transmission electron microscopy (TEM).

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INTERMAG 2006 - IEEE International Magnetics Conference

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