Cayley图序列可诊断度的下界

2010 XIth International Workshop on Symbolic and Numerical Methods, Modeling and Applications to Circuit Design (SM2ACD) Pub Date : 2010-12-17 DOI:10.1109/SM2ACD.2010.5672318

Toshinori Yamada

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引用次数: 0

摘要

本文通过推广一种已知的求CCC(立方连通循环)的下界的技术，给出了N顶点Cayley图的顺序可诊断度为Ω(N/D)，其中D为Cayley图的直径。由下界可知，N顶点星图和包裹蝴蝶的顺序可诊断度分别为Ω(N log logN /logN)和Ω(N/logN)。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Lower bound for degree of sequential diagnosability of Cayley graphs

This paper presents that the degree of sequential diagnosability of an N-vertex Cayley graph is Ω(N/D) by generalizing a known technique of finding a lower bound for that of a CCC(cube-connected cycles), where D is the diameter of the Cayley graph. From the lower bound, it is shown that the degrees of sequential diagnosability of the N-vertex star graph and wrapped butterfly are Ω(N log log N/logN) and Ω(N/logN), respectively.

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2010 XIth International Workshop on Symbolic and Numerical Methods, Modeling and Applications to Circuit Design (SM2ACD)

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