统一TMI2的自加热和老化模拟

2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Pub Date : 2014-10-23 DOI:10.1109/SISPAD.2014.6931631

Wai-kit Lee, Kasa Huang, Jim C. Liang, Juan-Yi Chen, Cheng Hsiao, Ke-Wei Su, Chung-Kai Lin, M. Jeng

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引用次数: 2

摘要

本文讨论了如何用TMI实现自加热和老化模型。文中给出了用TMI方法进行自加热和老化模拟的各种实例。在不牺牲精度的情况下，采用TMI方法进行自加热模拟所需的模拟时间大大缩短。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Unifying self-heating and aging simulations with TMI2

In this paper, we discuss how to implement the self heating and aging models with TMI. Various examples about self heating and aging simulations with TMI methodology are shown in this paper. Without trading-off the accuracy, the one with proposed TMI approach for self heating simulations takes much shorter simulation time.

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来源期刊

2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)

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