Q. Pelzer, L. Perrin, P. Notingher, X. Colin, M. Benhassine, A. Resmond, L. Flandin
{"title":"地下电力电缆的老化:物质从半导电层向绝缘层迁移","authors":"Q. Pelzer, L. Perrin, P. Notingher, X. Colin, M. Benhassine, A. Resmond, L. Flandin","doi":"10.1109/CEIDP.2018.8599029","DOIUrl":null,"url":null,"abstract":"Medium voltage underground cables were aged in air at temperatures between 70°C to 140°C. The changes of the structural properties of the crosslinked polyethylene (XLPE) insulating layer were characterized by physico-chemical techniques: Differential Scanning Calorimetry (DSC) and Fourier Transform Infrared Spectroscopy (FTIR). The performed analyses revealed chemical ageing (oxidation, chemical consumption of additives, post-crosslinking...) and physical ageing (migration of chemical species). The accelerated thermal tests on stripped XLPE samples showed, as expected, a mild oxidative degradation. In contrast, ageing tests conducted in the presence of the semi-conductive layers revealed a striking difference, with a migration of extra carbonyl species into the XLPE insulation.","PeriodicalId":377544,"journal":{"name":"2018 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Ageing of underground power cables: species migration from semi-conductive layers to the insulating layer\",\"authors\":\"Q. Pelzer, L. Perrin, P. Notingher, X. Colin, M. Benhassine, A. Resmond, L. Flandin\",\"doi\":\"10.1109/CEIDP.2018.8599029\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Medium voltage underground cables were aged in air at temperatures between 70°C to 140°C. The changes of the structural properties of the crosslinked polyethylene (XLPE) insulating layer were characterized by physico-chemical techniques: Differential Scanning Calorimetry (DSC) and Fourier Transform Infrared Spectroscopy (FTIR). The performed analyses revealed chemical ageing (oxidation, chemical consumption of additives, post-crosslinking...) and physical ageing (migration of chemical species). The accelerated thermal tests on stripped XLPE samples showed, as expected, a mild oxidative degradation. In contrast, ageing tests conducted in the presence of the semi-conductive layers revealed a striking difference, with a migration of extra carbonyl species into the XLPE insulation.\",\"PeriodicalId\":377544,\"journal\":{\"name\":\"2018 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)\",\"volume\":\"45 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEIDP.2018.8599029\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.2018.8599029","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Ageing of underground power cables: species migration from semi-conductive layers to the insulating layer
Medium voltage underground cables were aged in air at temperatures between 70°C to 140°C. The changes of the structural properties of the crosslinked polyethylene (XLPE) insulating layer were characterized by physico-chemical techniques: Differential Scanning Calorimetry (DSC) and Fourier Transform Infrared Spectroscopy (FTIR). The performed analyses revealed chemical ageing (oxidation, chemical consumption of additives, post-crosslinking...) and physical ageing (migration of chemical species). The accelerated thermal tests on stripped XLPE samples showed, as expected, a mild oxidative degradation. In contrast, ageing tests conducted in the presence of the semi-conductive layers revealed a striking difference, with a migration of extra carbonyl species into the XLPE insulation.
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