n量子点存在下AlGaN/GaN异质结构的负差分电容

A. Asgari
{"title":"n量子点存在下AlGaN/GaN异质结构的负差分电容","authors":"A. Asgari","doi":"10.1117/12.798950","DOIUrl":null,"url":null,"abstract":"In this work the capacitance of AlGaN/GaN heterostructure in presence of InN quantum dots has been studied. This calculation has been done for different InN quantum Dot size, energy dispersion and in different temperatures. The presence of InN quantum dot will cause a negative differential capacitance which can evidence the position of quantum dots in the structures. Our calculation results show this negative differential capacitance is much higher at low temperature and for quantum dots with low energy and higher size dispersion.","PeriodicalId":426962,"journal":{"name":"International Workshop and Conference on Photonics and Nanotechnology","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Negative differential capacitance of AlGaN/GaN heterostructure in presence of InN quantum dots\",\"authors\":\"A. Asgari\",\"doi\":\"10.1117/12.798950\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work the capacitance of AlGaN/GaN heterostructure in presence of InN quantum dots has been studied. This calculation has been done for different InN quantum Dot size, energy dispersion and in different temperatures. The presence of InN quantum dot will cause a negative differential capacitance which can evidence the position of quantum dots in the structures. Our calculation results show this negative differential capacitance is much higher at low temperature and for quantum dots with low energy and higher size dispersion.\",\"PeriodicalId\":426962,\"journal\":{\"name\":\"International Workshop and Conference on Photonics and Nanotechnology\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Workshop and Conference on Photonics and Nanotechnology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.798950\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Workshop and Conference on Photonics and Nanotechnology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.798950","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文研究了n量子点存在下AlGaN/GaN异质结构的电容特性。在不同的量子点尺寸、能量色散和温度条件下进行了计算。InN量子点的存在会产生负差分电容,这可以证明量子点在结构中的位置。我们的计算结果表明,在低温和低能量、高色散的量子点中,负差分电容要高得多。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Negative differential capacitance of AlGaN/GaN heterostructure in presence of InN quantum dots
In this work the capacitance of AlGaN/GaN heterostructure in presence of InN quantum dots has been studied. This calculation has been done for different InN quantum Dot size, energy dispersion and in different temperatures. The presence of InN quantum dot will cause a negative differential capacitance which can evidence the position of quantum dots in the structures. Our calculation results show this negative differential capacitance is much higher at low temperature and for quantum dots with low energy and higher size dispersion.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信