开发用于评估辐射抗性的微芯片参数监测方法

Materials of the All-Russian Scientific and Practical Conference "Modern aspects of modeling systems and processes" Pub Date : 2021-12-10 DOI:10.34220/mamsp_253-256

K. Zolnikov, I. Strukov, K. Chubur, S. Grechanyy, A. Yagodkin, E. Grosheva

{"title":"开发用于评估辐射抗性的微芯片参数监测方法","authors":"K. Zolnikov, I. Strukov, K. Chubur, S. Grechanyy, A. Yagodkin, E. Grosheva","doi":"10.34220/mamsp_253-256","DOIUrl":null,"url":null,"abstract":"This article discusses the technical means of monitoring the performance of a special-purpose ECB for experimental evaluation of radiation resistance, in the absence of test measuring equipment that allows you to control the areas of the most degraded degradation when exposed to ionizing radiation and heavy charged particles of outer space.","PeriodicalId":113054,"journal":{"name":"Materials of the All-Russian Scientific and Practical Conference \"Modern aspects of modeling systems and processes\"","volume":"111 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"DEVELOPMENT OF MEANS FOR MONITORING THE PARAMETERS OF MICROCHIPS FOR ASSESSING RADIATION RESISTANCE\",\"authors\":\"K. Zolnikov, I. Strukov, K. Chubur, S. Grechanyy, A. Yagodkin, E. Grosheva\",\"doi\":\"10.34220/mamsp_253-256\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article discusses the technical means of monitoring the performance of a special-purpose ECB for experimental evaluation of radiation resistance, in the absence of test measuring equipment that allows you to control the areas of the most degraded degradation when exposed to ionizing radiation and heavy charged particles of outer space.\",\"PeriodicalId\":113054,\"journal\":{\"name\":\"Materials of the All-Russian Scientific and Practical Conference \\\"Modern aspects of modeling systems and processes\\\"\",\"volume\":\"111 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-12-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Materials of the All-Russian Scientific and Practical Conference \\\"Modern aspects of modeling systems and processes\\\"\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.34220/mamsp_253-256\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Materials of the All-Russian Scientific and Practical Conference \"Modern aspects of modeling systems and processes\"","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.34220/mamsp_253-256","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

在没有测试测量设备的情况下，本文讨论了监测专用ECB性能的技术手段，该ECB用于抗辐射的实验评估，该测试测量设备允许您控制暴露于电离辐射和外太空重带电粒子时最退化的退化区域。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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DEVELOPMENT OF MEANS FOR MONITORING THE PARAMETERS OF MICROCHIPS FOR ASSESSING RADIATION RESISTANCE

This article discusses the technical means of monitoring the performance of a special-purpose ECB for experimental evaluation of radiation resistance, in the absence of test measuring equipment that allows you to control the areas of the most degraded degradation when exposed to ionizing radiation and heavy charged particles of outer space.

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Materials of the All-Russian Scientific and Practical Conference "Modern aspects of modeling systems and processes"

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