金属/高k界面的理论研究

Kenji Shiraishi, Takashi Nakayama, Seiichi Miyazaki, A. Ohta, Y. Akasaka, Heiji Watanabe, Yasuo Nara, K. Yamada
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引用次数: 0

摘要

我们发现高温处理后高功函数栅极金属(p-金属)的有效功变小,并且栅极金属的费米能级钉扎现象与p+多晶硅栅极相同。相反,金属与界面处高k波函数的本征杂化是决定低温处理后栅金属有效功函数的关键因素。如上所述,在高温和低温处理后,金属/高k界面性能有很大不同。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Theoretical investigations on metal/high-k interfaces
We have found that effective work functions of high-work function gate metals (p-metals) become small and Fermi level pinning of gate metals occurs after high temperature treatment as the same in the case in p+poly-Si gates. On the contrary, intrinsic hybridization between metal and high-k wave function at the interface is crucial factor to determine effective work function of gate metals after low temperature treatment. As discussed above, metal/high-k interface properties are much different each other after high- and low-temperature treatment.
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