基于极化和退极化电流的XLPE空间电荷测量方法

Siyan Lin, K. Zhou, Mingzhi Li
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引用次数: 2

摘要

为了通过空间电荷的脱陷过程来表征XLPE的老化程度,本文提出了一种从绝缘介质的极化和去极化电流(PDC)中提取脱陷电流的方法,以及计算被困电荷密度和陷阱深度的方法。通过改变PDC试验中的极化电压、注入电荷时间和样品的热老化程度,计算样品中的俘获电荷密度和俘获深度。结果表明,PDC试验中较高的电压能促进深阱中电荷的逸出;随着空间电荷注入时间的增加,中深圈闭比浅圈闭和深圈闭更容易积聚电荷;随着XLPE的时效,XLPE的热时效首先经历再结晶过程,然后进入热破坏期,结晶度的变化导致XLPE中的圈闭数量在整个热时效过程中先增加后减少,圈闭逐渐加深。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Space Charge Measurement Method of XLPE Based on Polarization and Depolarization Current
To characterize the aging degree of XLPE through the de-trapping progress of space charges, this paper presents a method to extract the de-trapping current from the Polarization and Depolarization Current (PDC) of the insulating medium and a method to calculate the trapped charge density and trap depth. After changing the polarization voltages in PDC tests and charge injection durations and the thermal aging degree of samples, trapped charge density and trap depth in samples are calculated. The results show that higher voltage in PDC tests can promote the charge escaping in deep traps; as the space charge injection duration increases, medium depth traps are more likely to accumulate charges than shallow traps and deep traps; with the aging of XLPE, thermal aging of XLPE first undergoes the recrystallization progress and then enters the thermal destruction period and the change of crystallinity leads to the number of traps in XLPE first increase and then decreases while traps gradually deepen during the whole thermal aging process.
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