钽微波超导谐振器中材料损耗通道的研究

Quantum 2.0 Conference and Exhibition Pub Date : 1900-01-01 DOI:10.1364/quantum.2022.qtu2a.25

A. Dutta, A. Place, K. Crowley, X. H. Le, Y. Gang, L. Rodgers, T. Madhavan, N. Khedkar, X. Gui, Y. Jia, L. Baker, A. Head, I. Jarrige, A. Hunt, I. Waluyo, A. Barbour, C. Weiland, S. Hulbert, M. Liu, A. Walter, R. Cava, A. Houck, N. D. de Leon

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引用次数: 2

摘要

我们通过将x射线光电子能谱测量与超导共面波导微波谐振器质量因子的功率和温度相关变化相关联，确定了钽中的候选损耗通道。

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Study of material loss channels in tantalum microwave superconducting resonators

We identify candidate loss channels in tantalum by correlating X-ray photoelectron spectroscopy measurements with power and temperature dependent variation of the quality factor of superconducting coplanar waveguide microwave resonators.

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Quantum 2.0 Conference and Exhibition

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