H. Doi, Y. Hara, K. Karasaki, Tadashi Iida, T. Furutani, Shigeki Kitamura, Norihiro Minatani, Satashi Shinada
{"title":"基于CAD数据的印刷电路板图案自动检测","authors":"H. Doi, Y. Hara, K. Karasaki, Tadashi Iida, T. Furutani, Shigeki Kitamura, Norihiro Minatani, Satashi Shinada","doi":"10.2493/JJSPE.59.993","DOIUrl":null,"url":null,"abstract":"Automated detcct~on of defects !n pr~nted circuit board ,,,, c~~~~~~ allgnm~nt Combarrurn I~gnsl% c~rcu~rs <lrtw~tr / patterns fnr mainframe computers is accomplished by a lystcm which compares PCB pattern< with correrponding CAD data. High speed fluorescence detectlon is achieved, using highly efficient fiber optic illumination. A ~impltfied reconstruction technique provtdes preciw images. A binarbzarion meihod that uses maximum and minimum derection along wi~h constant hinariraiton allow? detection of narrow cut.; and thin shorts. A bit pattern generator produces a bitrn;ippzd design data image from vector format CAD data. A partlrinn~ng and dividing technique reduces the design dara imegc lo flner hi1 irnapes ro hc adapted lo thosc detected by h~ur acquisirion system\\. To nvercorne thc rnevitahlc distortlons In PCBs, stretched or contracted patterns are carnpensated hy dynamically changing prxeI sire. A propo~ed defect c. ,~l,atity . recognition technique examinea not only defect rlze. hut alro ihe i-elationqhip wtih nearhy pnttems. As a rewlr, only hiltd~ l clcfect G are recognized ar defecta. Fatality rs recognized asynchronously in u stand-done ~rnage processor. so it does not waste inspection lime. This state-ot-the-an automated inxpection Fyqtem can dctect short circuiis ax rrnall as 7pm wirle in 4.5 min. on a MX)xHWmm PCB. P11nt.d C~rturt BoardPattem~","PeriodicalId":295384,"journal":{"name":"IAPR International Workshop on Machine Vision Applications","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Automated Inspection of Printed Circuit Board Patterns Referenced to CAD Data\",\"authors\":\"H. Doi, Y. Hara, K. Karasaki, Tadashi Iida, T. Furutani, Shigeki Kitamura, Norihiro Minatani, Satashi Shinada\",\"doi\":\"10.2493/JJSPE.59.993\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Automated detcct~on of defects !n pr~nted circuit board ,,,, c~~~~~~ allgnm~nt Combarrurn I~gnsl% c~rcu~rs <lrtw~tr / patterns fnr mainframe computers is accomplished by a lystcm which compares PCB pattern< with correrponding CAD data. High speed fluorescence detectlon is achieved, using highly efficient fiber optic illumination. A ~impltfied reconstruction technique provtdes preciw images. A binarbzarion meihod that uses maximum and minimum derection along wi~h constant hinariraiton allow? detection of narrow cut.; and thin shorts. A bit pattern generator produces a bitrn;ippzd design data image from vector format CAD data. A partlrinn~ng and dividing technique reduces the design dara imegc lo flner hi1 irnapes ro hc adapted lo thosc detected by h~ur acquisirion system\\\\. To nvercorne thc rnevitahlc distortlons In PCBs, stretched or contracted patterns are carnpensated hy dynamically changing prxeI sire. A propo~ed defect c. ,~l,atity . recognition technique examinea not only defect rlze. hut alro ihe i-elationqhip wtih nearhy pnttems. As a rewlr, only hiltd~ l clcfect G are recognized ar defecta. Fatality rs recognized asynchronously in u stand-done ~rnage processor. so it does not waste inspection lime. This state-ot-the-an automated inxpection Fyqtem can dctect short circuiis ax rrnall as 7pm wirle in 4.5 min. on a MX)xHWmm PCB. P11nt.d C~rturt BoardPattem~\",\"PeriodicalId\":295384,\"journal\":{\"name\":\"IAPR International Workshop on Machine Vision Applications\",\"volume\":\"25 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IAPR International Workshop on Machine Vision Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.2493/JJSPE.59.993\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IAPR International Workshop on Machine Vision Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2493/JJSPE.59.993","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}