{"title":"微波场控制的电磁感应聚焦","authors":"O. N. Verma, Sourabh Roy","doi":"10.23919/MOC.2017.8244531","DOIUrl":null,"url":null,"abstract":"We have theoretically predicted the effect of a microwave field on cross-focusing of an optical weak probe beam by a copropagating non-uniform control beam in an electromagnetically-induced transparency medium. Our numerical simulation shows probe beam focusing about 30% of its initial width in absence of microwave, whereas it focuses 70% in presence of microwave field.","PeriodicalId":123743,"journal":{"name":"2017 22nd Microoptics Conference (MOC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Electromagnetically-induced focusing controlled by a microwave field\",\"authors\":\"O. N. Verma, Sourabh Roy\",\"doi\":\"10.23919/MOC.2017.8244531\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We have theoretically predicted the effect of a microwave field on cross-focusing of an optical weak probe beam by a copropagating non-uniform control beam in an electromagnetically-induced transparency medium. Our numerical simulation shows probe beam focusing about 30% of its initial width in absence of microwave, whereas it focuses 70% in presence of microwave field.\",\"PeriodicalId\":123743,\"journal\":{\"name\":\"2017 22nd Microoptics Conference (MOC)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 22nd Microoptics Conference (MOC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/MOC.2017.8244531\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 22nd Microoptics Conference (MOC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/MOC.2017.8244531","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Electromagnetically-induced focusing controlled by a microwave field
We have theoretically predicted the effect of a microwave field on cross-focusing of an optical weak probe beam by a copropagating non-uniform control beam in an electromagnetically-induced transparency medium. Our numerical simulation shows probe beam focusing about 30% of its initial width in absence of microwave, whereas it focuses 70% in presence of microwave field.