{"title":"2022年ICCAD CAD竞赛题目B: D2D垂直连接的3D布局","authors":"Kai-Shun Hu, I-Jye Lin, Yu-Hui Huang, Hao-Yu Chi, Yi-Hsuan Wu, Cindy Chin-Fang Shen","doi":"10.1145/3508352.3561108","DOIUrl":null,"url":null,"abstract":"In the chiplet era, the benefits from multiple factors can be observed by splitting a large single die into multiple small dies. By having the multiple small dies with die-to-die (D2D) vertical connections, the benefits including: 1) better yield, 2) better timing/performance, and 3) better cost. How to do the netlist partitioning, cell placement in each of the small dies, and also how to determine the location of the D2D inter-connection terminals becomes a new topic.To address this chiplet era physical implementation problem, ICCAD-2022 contest encourages the research in the techniques of multi-die netlist partitioning and placement with D2D vertical connections. We provided (i) a set of benchmarks and (ii) an evaluation metric that facilitate contestants to develop, test, and evaluate their new algorithms.","PeriodicalId":270592,"journal":{"name":"2022 IEEE/ACM International Conference On Computer Aided Design (ICCAD)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"2022 ICCAD CAD Contest Problem B: 3D Placement with D2D Vertical Connections\",\"authors\":\"Kai-Shun Hu, I-Jye Lin, Yu-Hui Huang, Hao-Yu Chi, Yi-Hsuan Wu, Cindy Chin-Fang Shen\",\"doi\":\"10.1145/3508352.3561108\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In the chiplet era, the benefits from multiple factors can be observed by splitting a large single die into multiple small dies. By having the multiple small dies with die-to-die (D2D) vertical connections, the benefits including: 1) better yield, 2) better timing/performance, and 3) better cost. How to do the netlist partitioning, cell placement in each of the small dies, and also how to determine the location of the D2D inter-connection terminals becomes a new topic.To address this chiplet era physical implementation problem, ICCAD-2022 contest encourages the research in the techniques of multi-die netlist partitioning and placement with D2D vertical connections. We provided (i) a set of benchmarks and (ii) an evaluation metric that facilitate contestants to develop, test, and evaluate their new algorithms.\",\"PeriodicalId\":270592,\"journal\":{\"name\":\"2022 IEEE/ACM International Conference On Computer Aided Design (ICCAD)\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-10-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE/ACM International Conference On Computer Aided Design (ICCAD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/3508352.3561108\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE/ACM International Conference On Computer Aided Design (ICCAD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/3508352.3561108","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
2022 ICCAD CAD Contest Problem B: 3D Placement with D2D Vertical Connections
In the chiplet era, the benefits from multiple factors can be observed by splitting a large single die into multiple small dies. By having the multiple small dies with die-to-die (D2D) vertical connections, the benefits including: 1) better yield, 2) better timing/performance, and 3) better cost. How to do the netlist partitioning, cell placement in each of the small dies, and also how to determine the location of the D2D inter-connection terminals becomes a new topic.To address this chiplet era physical implementation problem, ICCAD-2022 contest encourages the research in the techniques of multi-die netlist partitioning and placement with D2D vertical connections. We provided (i) a set of benchmarks and (ii) an evaluation metric that facilitate contestants to develop, test, and evaluate their new algorithms.