{"title":"形态骨架算法用于PDP生产线检测","authors":"R. Ge, David A Clausi","doi":"10.1109/CCECE.2001.933598","DOIUrl":null,"url":null,"abstract":"Morphological skeletonization is an image processing technique that reduces complex, thick-lined images to a series of single pixel lines that accurately represent the original shapes. This procedure is especially useful to simplify automated applications requiring simple shape analysis and continuity checking by reducing the amount of redundant image data. In the semiconductor inspection field, skeletonization is a process that can be used to detect defects during plasma display panel (PDP) inspection. This paper introduces a novel morphological skeletonization algorithm developed for electrode pattern inspection of PDPs. This algorithm has been successfully integrated within a commercial machine vision system.","PeriodicalId":184523,"journal":{"name":"Canadian Conference on Electrical and Computer Engineering 2001. Conference Proceedings (Cat. No.01TH8555)","volume":"93 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Morphological skeleton algorithm for PDP production line inspection\",\"authors\":\"R. Ge, David A Clausi\",\"doi\":\"10.1109/CCECE.2001.933598\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Morphological skeletonization is an image processing technique that reduces complex, thick-lined images to a series of single pixel lines that accurately represent the original shapes. This procedure is especially useful to simplify automated applications requiring simple shape analysis and continuity checking by reducing the amount of redundant image data. In the semiconductor inspection field, skeletonization is a process that can be used to detect defects during plasma display panel (PDP) inspection. This paper introduces a novel morphological skeletonization algorithm developed for electrode pattern inspection of PDPs. This algorithm has been successfully integrated within a commercial machine vision system.\",\"PeriodicalId\":184523,\"journal\":{\"name\":\"Canadian Conference on Electrical and Computer Engineering 2001. Conference Proceedings (Cat. No.01TH8555)\",\"volume\":\"93 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-05-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Canadian Conference on Electrical and Computer Engineering 2001. Conference Proceedings (Cat. No.01TH8555)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CCECE.2001.933598\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Canadian Conference on Electrical and Computer Engineering 2001. Conference Proceedings (Cat. No.01TH8555)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CCECE.2001.933598","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Morphological skeleton algorithm for PDP production line inspection
Morphological skeletonization is an image processing technique that reduces complex, thick-lined images to a series of single pixel lines that accurately represent the original shapes. This procedure is especially useful to simplify automated applications requiring simple shape analysis and continuity checking by reducing the amount of redundant image data. In the semiconductor inspection field, skeletonization is a process that can be used to detect defects during plasma display panel (PDP) inspection. This paper introduces a novel morphological skeletonization algorithm developed for electrode pattern inspection of PDPs. This algorithm has been successfully integrated within a commercial machine vision system.