{"title":"单行载流子双异质结光电晶体管响应速度的新方法:基区双侧入射","authors":"Liang Chen","doi":"10.5220/0008868604130415","DOIUrl":null,"url":null,"abstract":": In this paper, a new method to improve the response speed of an SiGe-based uni-traveling-carrier double heterojunction phototransistor (UTC-DHPT) are illustrated. The detailed analysis show that bilateral incidence from the base region has better performances than one incidence from the base region.","PeriodicalId":186406,"journal":{"name":"Proceedings of 5th International Conference on Vehicle, Mechanical and Electrical Engineering","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A New Method on Response Speed of Uni-traveling-carrier Double Heterojunction Phototransistor: Bilateral Incidence from the Base Region\",\"authors\":\"Liang Chen\",\"doi\":\"10.5220/0008868604130415\",\"DOIUrl\":null,\"url\":null,\"abstract\":\": In this paper, a new method to improve the response speed of an SiGe-based uni-traveling-carrier double heterojunction phototransistor (UTC-DHPT) are illustrated. The detailed analysis show that bilateral incidence from the base region has better performances than one incidence from the base region.\",\"PeriodicalId\":186406,\"journal\":{\"name\":\"Proceedings of 5th International Conference on Vehicle, Mechanical and Electrical Engineering\",\"volume\":\"41 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 5th International Conference on Vehicle, Mechanical and Electrical Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.5220/0008868604130415\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 5th International Conference on Vehicle, Mechanical and Electrical Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.5220/0008868604130415","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A New Method on Response Speed of Uni-traveling-carrier Double Heterojunction Phototransistor: Bilateral Incidence from the Base Region
: In this paper, a new method to improve the response speed of an SiGe-based uni-traveling-carrier double heterojunction phototransistor (UTC-DHPT) are illustrated. The detailed analysis show that bilateral incidence from the base region has better performances than one incidence from the base region.