W/sup +6//W/sup +5/ /纳米晶tio2 /sub /光活性电极界面氧化还原反应

1998 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings (Cat. No.98EX140) Pub Date : 1998-12-14 DOI:10.1109/COMMAD.1998.791685

Yongxiang Li, J. Hagen, D. Haarer

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引用次数: 0

摘要

采用稳态光导技术对纳米tio2 /sub /薄膜的光电流进行了探测。tio2 /sub - 2/薄膜具有较宽的单峰(280 ~ 410 nm)光电流谱。在360 nm处光电流最大值与锐钛矿的直接带隙有关。在近紫外光的吸收下，半导体tio2 /sub - 2/纳米粒子与溶液的界面处形成电子-空穴对，导致溶液(W/sup +6//W/sup +5/)发生氧化还原反应。讨论了这种光驱动过程的机理以及在光电化学电池和微粒光致变色系统中的潜在应用。

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W/sup +6//W/sup +5/ redox reactions at the interface of the nanocrystalline TiO/sub 2/ photoactive electrode

Photocurrent of nanocrystalline TiO/sub 2/ thin films has been probed by using a steady-state photoconduction technique. A broad single peak (280-410 nm) photocurrent spectrum was observed for the TiO/sub 2/ thin films. The photocurrent maximum at about 360 nm associates with the direct band gap of anatase TiO/sub 2/. The electron-hole pair formation that occurs at the interface between semiconductor TiO/sub 2/ nanoparticles and a solution upon absorption of near UV light leads to redox reactions of solution species (W/sup +6//W/sup +5/). The mechanism of such photodriven processes are discussed along with the potential applications in photoelectrochemical cells and as particulate photochromic systems.

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1998 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings (Cat. No.98EX140)

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