磁控管元件错位自动检测系统

Kyung-ja Park, C. Hong
{"title":"磁控管元件错位自动检测系统","authors":"Kyung-ja Park, C. Hong","doi":"10.1109/ISIE.1997.649084","DOIUrl":null,"url":null,"abstract":"This paper describes an automatic inspection system which detects misalignment between two components of the magnetron on an automated assembly line for microwave oven manufacturing. On inspecting misaligned components, their relative position should be determined even though the components are being rotated. For this operation, a special purpose algorithm has been designed. This algorithm uses the local features of components and detects the part's boundary with a /spl theta/-projection method. Using this system two magnetrons can be inspected simultaneously with a detection speed of 1.5 seconds. Operation of the system shows consistent quality inspection with an accuracy of 1 pixel.","PeriodicalId":134474,"journal":{"name":"ISIE '97 Proceeding of the IEEE International Symposium on Industrial Electronics","volume":"197 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Automatic inspection system for misaligned magnetron components\",\"authors\":\"Kyung-ja Park, C. Hong\",\"doi\":\"10.1109/ISIE.1997.649084\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes an automatic inspection system which detects misalignment between two components of the magnetron on an automated assembly line for microwave oven manufacturing. On inspecting misaligned components, their relative position should be determined even though the components are being rotated. For this operation, a special purpose algorithm has been designed. This algorithm uses the local features of components and detects the part's boundary with a /spl theta/-projection method. Using this system two magnetrons can be inspected simultaneously with a detection speed of 1.5 seconds. Operation of the system shows consistent quality inspection with an accuracy of 1 pixel.\",\"PeriodicalId\":134474,\"journal\":{\"name\":\"ISIE '97 Proceeding of the IEEE International Symposium on Industrial Electronics\",\"volume\":\"197 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-07-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ISIE '97 Proceeding of the IEEE International Symposium on Industrial Electronics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISIE.1997.649084\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ISIE '97 Proceeding of the IEEE International Symposium on Industrial Electronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISIE.1997.649084","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文介绍了一种用于微波炉自动化装配线上磁控管两部件不对中检测的自动检测系统。在检查不对中部件时,即使部件正在旋转,也应确定其相对位置。为此,设计了一种专用算法。该算法利用部件的局部特征,采用/spl theta/-投影法检测部件的边界。该系统可同时检测两个磁控管,检测速度为1.5秒。系统运行显示质量检测一致,精度为1像素。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Automatic inspection system for misaligned magnetron components
This paper describes an automatic inspection system which detects misalignment between two components of the magnetron on an automated assembly line for microwave oven manufacturing. On inspecting misaligned components, their relative position should be determined even though the components are being rotated. For this operation, a special purpose algorithm has been designed. This algorithm uses the local features of components and detects the part's boundary with a /spl theta/-projection method. Using this system two magnetrons can be inspected simultaneously with a detection speed of 1.5 seconds. Operation of the system shows consistent quality inspection with an accuracy of 1 pixel.
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