{"title":"磁控管元件错位自动检测系统","authors":"Kyung-ja Park, C. Hong","doi":"10.1109/ISIE.1997.649084","DOIUrl":null,"url":null,"abstract":"This paper describes an automatic inspection system which detects misalignment between two components of the magnetron on an automated assembly line for microwave oven manufacturing. On inspecting misaligned components, their relative position should be determined even though the components are being rotated. For this operation, a special purpose algorithm has been designed. This algorithm uses the local features of components and detects the part's boundary with a /spl theta/-projection method. Using this system two magnetrons can be inspected simultaneously with a detection speed of 1.5 seconds. Operation of the system shows consistent quality inspection with an accuracy of 1 pixel.","PeriodicalId":134474,"journal":{"name":"ISIE '97 Proceeding of the IEEE International Symposium on Industrial Electronics","volume":"197 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Automatic inspection system for misaligned magnetron components\",\"authors\":\"Kyung-ja Park, C. Hong\",\"doi\":\"10.1109/ISIE.1997.649084\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes an automatic inspection system which detects misalignment between two components of the magnetron on an automated assembly line for microwave oven manufacturing. On inspecting misaligned components, their relative position should be determined even though the components are being rotated. For this operation, a special purpose algorithm has been designed. This algorithm uses the local features of components and detects the part's boundary with a /spl theta/-projection method. Using this system two magnetrons can be inspected simultaneously with a detection speed of 1.5 seconds. Operation of the system shows consistent quality inspection with an accuracy of 1 pixel.\",\"PeriodicalId\":134474,\"journal\":{\"name\":\"ISIE '97 Proceeding of the IEEE International Symposium on Industrial Electronics\",\"volume\":\"197 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-07-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ISIE '97 Proceeding of the IEEE International Symposium on Industrial Electronics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISIE.1997.649084\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ISIE '97 Proceeding of the IEEE International Symposium on Industrial Electronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISIE.1997.649084","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Automatic inspection system for misaligned magnetron components
This paper describes an automatic inspection system which detects misalignment between two components of the magnetron on an automated assembly line for microwave oven manufacturing. On inspecting misaligned components, their relative position should be determined even though the components are being rotated. For this operation, a special purpose algorithm has been designed. This algorithm uses the local features of components and detects the part's boundary with a /spl theta/-projection method. Using this system two magnetrons can be inspected simultaneously with a detection speed of 1.5 seconds. Operation of the system shows consistent quality inspection with an accuracy of 1 pixel.