一种使用双可合成处理器核心的故障安全微处理器

K. Shimamura, S. Yamaguchi, N. Kanekawa, N. Miyazaki, H. Yamada, Y. Takahashi, T. Hirotsu, K. Tomobe, K. Satoh, T. Hotta, R. Fujita
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引用次数: 7

摘要

采用0.35 /spl μ m CMOS嵌入式门阵列,研制了一种芯片级冗余自检故障安全微处理器。该微处理器在单个芯片中集成了两个可合成的处理器内核和一个自检比较器。为此,将一个完全自定义的处理器核心转换为每个可合成的核心。适合重用可合成处理器内核的设计方法也得到了发展。开发的可合成处理器内核和设计方法降低了芯片的工艺迁移成本。迁移到较新的工艺可以提高已开发微处理器的性能,同时降低开发成本。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A fail-safe microprocessor using dual synthesizable processor cores
A chip level redundant self-checking fail-safe microprocessor has been developed using a 0.35 /spl mu/m CMOS embedded gate array. The microprocessor integrates two synthesizable processor cores and a self-checking comparator in a single chip. A full-custom processor core was transformed into each of the synthesizable cores for this purpose. Design methodologies suitable for reusing synthesizable processor cores has also been developed. Developed synthesizable processor cores and design methodologies reduce the cost of process migration of the chip. Migrating to the newer process improves the performance of the developed microprocessor with low development cost.
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