Characterization of Materials for Optical Wireless Channel Simulation

This article proposes a new method to optically characterize materials, which is a very sensitive input data for realistic channel simulation based on Monte-Carlo Ray-Tracing algorithms. This original approach consists first in performing some optical power measurements based on a simple and low-cost experimental setup. These data then feed an optimization algorithm allowing to find the parameters of materials’ reflection models that lead to simulation results fitting the measurements. As a proof of concept, our first results consider only simulated data as virtual measurement. They show that this approach gives very good agreement between estimated and actual optical characteristics of materials in canonical environment.