{"title":"一个非常大的电流，宽带宽电压源的微处理器测试","authors":"N.J. Barabas","doi":"10.1109/APEC.1998.647684","DOIUrl":null,"url":null,"abstract":"The design of a unique, state-of-the-art voltage source (Vs) is described. It is a subsystem of a VLSI tester, and powers the device under test (DUT). It is fully programmable and has extensive measurement capabilities. Its ratings include zero to 6 volts output at 50 amps per circuit board, 300 Amps maximum, with an under 1 /spl mu/sec response time to transient loads.","PeriodicalId":156715,"journal":{"name":"APEC '98 Thirteenth Annual Applied Power Electronics Conference and Exposition","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-02-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"A very high current, wide bandwidth voltage source for microprocessor testing\",\"authors\":\"N.J. Barabas\",\"doi\":\"10.1109/APEC.1998.647684\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The design of a unique, state-of-the-art voltage source (Vs) is described. It is a subsystem of a VLSI tester, and powers the device under test (DUT). It is fully programmable and has extensive measurement capabilities. Its ratings include zero to 6 volts output at 50 amps per circuit board, 300 Amps maximum, with an under 1 /spl mu/sec response time to transient loads.\",\"PeriodicalId\":156715,\"journal\":{\"name\":\"APEC '98 Thirteenth Annual Applied Power Electronics Conference and Exposition\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-02-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"APEC '98 Thirteenth Annual Applied Power Electronics Conference and Exposition\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APEC.1998.647684\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"APEC '98 Thirteenth Annual Applied Power Electronics Conference and Exposition","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEC.1998.647684","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A very high current, wide bandwidth voltage source for microprocessor testing
The design of a unique, state-of-the-art voltage source (Vs) is described. It is a subsystem of a VLSI tester, and powers the device under test (DUT). It is fully programmable and has extensive measurement capabilities. Its ratings include zero to 6 volts output at 50 amps per circuit board, 300 Amps maximum, with an under 1 /spl mu/sec response time to transient loads.
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