{"title":"工业环境中样品稀缺性的按需多类成像","authors":"Joan Orti, F. Moreno-Noguer, V. Puig","doi":"10.1145/3589572.3589573","DOIUrl":null,"url":null,"abstract":"While technology pushes towards controlling more and more complex industrial processes, data related issues are still a non-trivial problem to address. In this sense, class imbalances and scarcity of data occupy a lot of time and resources when designing a solution. In the surface defect detection problem, due to the random nature of the process, both situations are very common as well as a general decompensation between the image size and the defect size. In this work, we address a segmentation and classification problem with very few available images from every class, proposing a two-step process. First, by generating fake images using the guided-crop image augmentation method, we train for every single class a Pix2pix model in order to perform a mask-to-image translation. Once the model is trained, we also designed a automatic mask generator, to mimic the shapes of the dataset and thus create real-like images for every class using the pretrained networks. Eventually, using a context aggregation network, we use these fake images as our training set, changing every certain epochs the amount of images of every class on-demand, depending on the evolution of the individual loss term of every class. As a result, we accomplished stable and robust segmentation and classification metrics, regardless of the amount of data available for training, using the NEU Micro surface defect database.","PeriodicalId":296325,"journal":{"name":"Proceedings of the 2023 6th International Conference on Machine Vision and Applications","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"On-Demand Multiclass Imaging for Sample Scarcity in Industrial Environments\",\"authors\":\"Joan Orti, F. Moreno-Noguer, V. Puig\",\"doi\":\"10.1145/3589572.3589573\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"While technology pushes towards controlling more and more complex industrial processes, data related issues are still a non-trivial problem to address. In this sense, class imbalances and scarcity of data occupy a lot of time and resources when designing a solution. In the surface defect detection problem, due to the random nature of the process, both situations are very common as well as a general decompensation between the image size and the defect size. In this work, we address a segmentation and classification problem with very few available images from every class, proposing a two-step process. First, by generating fake images using the guided-crop image augmentation method, we train for every single class a Pix2pix model in order to perform a mask-to-image translation. Once the model is trained, we also designed a automatic mask generator, to mimic the shapes of the dataset and thus create real-like images for every class using the pretrained networks. Eventually, using a context aggregation network, we use these fake images as our training set, changing every certain epochs the amount of images of every class on-demand, depending on the evolution of the individual loss term of every class. As a result, we accomplished stable and robust segmentation and classification metrics, regardless of the amount of data available for training, using the NEU Micro surface defect database.\",\"PeriodicalId\":296325,\"journal\":{\"name\":\"Proceedings of the 2023 6th International Conference on Machine Vision and Applications\",\"volume\":\"62 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-03-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 2023 6th International Conference on Machine Vision and Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/3589572.3589573\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2023 6th International Conference on Machine Vision and Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/3589572.3589573","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
On-Demand Multiclass Imaging for Sample Scarcity in Industrial Environments
While technology pushes towards controlling more and more complex industrial processes, data related issues are still a non-trivial problem to address. In this sense, class imbalances and scarcity of data occupy a lot of time and resources when designing a solution. In the surface defect detection problem, due to the random nature of the process, both situations are very common as well as a general decompensation between the image size and the defect size. In this work, we address a segmentation and classification problem with very few available images from every class, proposing a two-step process. First, by generating fake images using the guided-crop image augmentation method, we train for every single class a Pix2pix model in order to perform a mask-to-image translation. Once the model is trained, we also designed a automatic mask generator, to mimic the shapes of the dataset and thus create real-like images for every class using the pretrained networks. Eventually, using a context aggregation network, we use these fake images as our training set, changing every certain epochs the amount of images of every class on-demand, depending on the evolution of the individual loss term of every class. As a result, we accomplished stable and robust segmentation and classification metrics, regardless of the amount of data available for training, using the NEU Micro surface defect database.