{"title":"ASIC技术培训——挑战与机遇","authors":"N. Ballinger","doi":"10.1109/ASIC.1989.123251","DOIUrl":null,"url":null,"abstract":"The author explores the challenges for ASIC (application-specific integrated circuit) technical training, now and in the future, in the area of standard product vs. ASIC training (i.e. microcontrollers). She examines the opportunity for setting the ASIC customer up for success through training. Specifically, the author introduces a method for training designed to reduce the risk involved in ASIC design. She explores some future opportunities for educating industry and universities in the area of ASIC design.<<ETX>>","PeriodicalId":245997,"journal":{"name":"Proceedings., Second Annual IEEE ASIC Seminar and Exhibit,","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"ASIC technical training-the challenges and opportunities\",\"authors\":\"N. Ballinger\",\"doi\":\"10.1109/ASIC.1989.123251\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The author explores the challenges for ASIC (application-specific integrated circuit) technical training, now and in the future, in the area of standard product vs. ASIC training (i.e. microcontrollers). She examines the opportunity for setting the ASIC customer up for success through training. Specifically, the author introduces a method for training designed to reduce the risk involved in ASIC design. She explores some future opportunities for educating industry and universities in the area of ASIC design.<<ETX>>\",\"PeriodicalId\":245997,\"journal\":{\"name\":\"Proceedings., Second Annual IEEE ASIC Seminar and Exhibit,\",\"volume\":\"31 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-09-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings., Second Annual IEEE ASIC Seminar and Exhibit,\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASIC.1989.123251\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., Second Annual IEEE ASIC Seminar and Exhibit,","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASIC.1989.123251","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
ASIC technical training-the challenges and opportunities
The author explores the challenges for ASIC (application-specific integrated circuit) technical training, now and in the future, in the area of standard product vs. ASIC training (i.e. microcontrollers). She examines the opportunity for setting the ASIC customer up for success through training. Specifically, the author introduces a method for training designed to reduce the risk involved in ASIC design. She explores some future opportunities for educating industry and universities in the area of ASIC design.<>
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
