{"title":"通过基于功能的解决方案提高安全关键应用的可靠性","authors":"E. Sánchez","doi":"10.1109/DTIS.2018.8368555","DOIUrl":null,"url":null,"abstract":"In this paper, the author provides a brief guideline to effectively generate and run test programs for microprocessor-based systems running safety-critical applications. The most important constraints that need to be considered during the generation phase, as well as during the execution time are described. Additionally, a comparison is provided by checking three different SBST strategies on a particular module of a pipelined processor core.","PeriodicalId":328650,"journal":{"name":"2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-04-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Increasing reliability of safety critical applications through functional based solutions\",\"authors\":\"E. Sánchez\",\"doi\":\"10.1109/DTIS.2018.8368555\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, the author provides a brief guideline to effectively generate and run test programs for microprocessor-based systems running safety-critical applications. The most important constraints that need to be considered during the generation phase, as well as during the execution time are described. Additionally, a comparison is provided by checking three different SBST strategies on a particular module of a pipelined processor core.\",\"PeriodicalId\":328650,\"journal\":{\"name\":\"2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-04-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DTIS.2018.8368555\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DTIS.2018.8368555","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Increasing reliability of safety critical applications through functional based solutions
In this paper, the author provides a brief guideline to effectively generate and run test programs for microprocessor-based systems running safety-critical applications. The most important constraints that need to be considered during the generation phase, as well as during the execution time are described. Additionally, a comparison is provided by checking three different SBST strategies on a particular module of a pipelined processor core.