用s参数测量法确定与芯片测试线路结构相关的产品上与频率相关的传输线参数

Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710) Pub Date : 2003-12-08 DOI:10.1109/EPEP.2003.1250008

T. Winkel, M.F. Ktata, T. Ludwig, H. Schettler, H. Grabinski, E. Klink

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引用次数: 3

摘要

频率相关的传播常数、特性阻抗以及R、L、C和G参数由片上s参数测量确定。传输线测试结构嵌入多层测试芯片中。由于非理想的芯片环境的测量限制显示和讨论。实测结果与仿真结果吻合良好。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Determination of frequency dependent transmission line parameters on product related on chip test line structures using S-parameter measurements

The frequency dependent propagation constant, characteristic impedance as well as the R, L, C and G parameters are determined from on chip S-parameter measurements. The transmission line test structures are embedded in a multi layer test chip. Measurement limitations due to a non ideal chip environment are shown and discussed. Measured and simulated results show a very good agreement.

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来源期刊

Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)

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