二值时域反射法:一种更简单、更有效的有线网络缺陷诊断方法

F. Auzanneau
{"title":"二值时域反射法:一种更简单、更有效的有线网络缺陷诊断方法","authors":"F. Auzanneau","doi":"10.1109/AUTEST.2018.8532526","DOIUrl":null,"url":null,"abstract":"Today, the most efficient methods for wired networks diagnosis are based on reflectometry: they can detect hard (i.e. open / short circuits) and soft defects (i.e. insulation damage, hot spots or rust), either permanent or intermittent, and provide their location. This is an important information for maintenance operators who can focus repair in a shorter time. The possibility of monitoring the wires health using specifically designed reflectometry methods offers interesting opportunities for preventive maintenance. Electronic implementations of such methods are mostly based on the use of programmable logic digital systems, such as FPGA or microcontrollers, both for probe signals generation and measured signals analysis. But the cables have a pure analog behavior, therefore these systems are connected to additional costly devices such as digital to analog and analog to digital converters. These components have a direct impact on the systems performances: a higher sampling rate means a better defects location accuracy, but implies a higher cost. A higher resolution enables to detect lower signature defects but requires more memory and computing power for data processing. This paper presents a new purely binary reflectometry method using a simpler electronic architecture and quicker signal analysis, and showing better performances than standard methods (in terms of defect location accuracy, processing speed and memory requirement) at a lower cost. Equivalent detection performances are shown, and the new simplified electronic architecture enables to take advantage of all the digital resources, such as a higher clock frequency than that of most available converters, thus naturally improving the location accuracy. As the conversion components are not required anymore, the consumption and cost of the system is drastically reduced. Performance comparison is presented and an innovative process for the reflectogram computation is introduced, which enables a drastic reduction of the computing power needs and a quicker reflectogram update.","PeriodicalId":384058,"journal":{"name":"2018 IEEE AUTOTESTCON","volume":"224 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Binary time domain reflectometry: a simpler and more efficient way of diagnosing defects in wired networks\",\"authors\":\"F. Auzanneau\",\"doi\":\"10.1109/AUTEST.2018.8532526\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Today, the most efficient methods for wired networks diagnosis are based on reflectometry: they can detect hard (i.e. open / short circuits) and soft defects (i.e. insulation damage, hot spots or rust), either permanent or intermittent, and provide their location. This is an important information for maintenance operators who can focus repair in a shorter time. The possibility of monitoring the wires health using specifically designed reflectometry methods offers interesting opportunities for preventive maintenance. Electronic implementations of such methods are mostly based on the use of programmable logic digital systems, such as FPGA or microcontrollers, both for probe signals generation and measured signals analysis. But the cables have a pure analog behavior, therefore these systems are connected to additional costly devices such as digital to analog and analog to digital converters. These components have a direct impact on the systems performances: a higher sampling rate means a better defects location accuracy, but implies a higher cost. A higher resolution enables to detect lower signature defects but requires more memory and computing power for data processing. This paper presents a new purely binary reflectometry method using a simpler electronic architecture and quicker signal analysis, and showing better performances than standard methods (in terms of defect location accuracy, processing speed and memory requirement) at a lower cost. Equivalent detection performances are shown, and the new simplified electronic architecture enables to take advantage of all the digital resources, such as a higher clock frequency than that of most available converters, thus naturally improving the location accuracy. As the conversion components are not required anymore, the consumption and cost of the system is drastically reduced. Performance comparison is presented and an innovative process for the reflectogram computation is introduced, which enables a drastic reduction of the computing power needs and a quicker reflectogram update.\",\"PeriodicalId\":384058,\"journal\":{\"name\":\"2018 IEEE AUTOTESTCON\",\"volume\":\"224 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE AUTOTESTCON\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2018.8532526\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2018.8532526","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

摘要

今天,最有效的有线网络诊断方法是基于反射计:它们可以检测永久性或间歇性的硬缺陷(即开路/短路)和软缺陷(即绝缘损坏,热点或生锈),并提供其位置。这对维修人员来说是一个重要的信息,可以在更短的时间内集中精力进行维修。使用专门设计的反射测量方法监测电线健康状况的可能性为预防性维护提供了有趣的机会。这些方法的电子实现主要基于使用可编程逻辑数字系统,如FPGA或微控制器,用于探头信号的生成和测量信号的分析。但是电缆具有纯模拟行为,因此这些系统连接到额外的昂贵设备,如数模转换器和模数转换器。这些组件对系统性能有直接的影响:更高的采样率意味着更好的缺陷定位精度,但意味着更高的成本。分辨率越高,检测到的签名缺陷越少,但对数据处理的内存和计算能力要求越高。本文提出了一种新的纯二进制反射法,该方法具有更简单的电子结构和更快的信号分析速度,并且在缺陷定位精度、处理速度和内存需求方面比标准方法具有更好的性能,而且成本更低。显示了等效的检测性能,并且新的简化电子架构能够利用所有数字资源,例如比大多数可用转换器更高的时钟频率,从而自然地提高了定位精度。由于不再需要转换元件,因此大大降低了系统的消耗和成本。给出了性能比较,并介绍了一种创新的反射图计算过程,该过程可以大幅降低计算能力需求并更快地更新反射图。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Binary time domain reflectometry: a simpler and more efficient way of diagnosing defects in wired networks
Today, the most efficient methods for wired networks diagnosis are based on reflectometry: they can detect hard (i.e. open / short circuits) and soft defects (i.e. insulation damage, hot spots or rust), either permanent or intermittent, and provide their location. This is an important information for maintenance operators who can focus repair in a shorter time. The possibility of monitoring the wires health using specifically designed reflectometry methods offers interesting opportunities for preventive maintenance. Electronic implementations of such methods are mostly based on the use of programmable logic digital systems, such as FPGA or microcontrollers, both for probe signals generation and measured signals analysis. But the cables have a pure analog behavior, therefore these systems are connected to additional costly devices such as digital to analog and analog to digital converters. These components have a direct impact on the systems performances: a higher sampling rate means a better defects location accuracy, but implies a higher cost. A higher resolution enables to detect lower signature defects but requires more memory and computing power for data processing. This paper presents a new purely binary reflectometry method using a simpler electronic architecture and quicker signal analysis, and showing better performances than standard methods (in terms of defect location accuracy, processing speed and memory requirement) at a lower cost. Equivalent detection performances are shown, and the new simplified electronic architecture enables to take advantage of all the digital resources, such as a higher clock frequency than that of most available converters, thus naturally improving the location accuracy. As the conversion components are not required anymore, the consumption and cost of the system is drastically reduced. Performance comparison is presented and an innovative process for the reflectogram computation is introduced, which enables a drastic reduction of the computing power needs and a quicker reflectogram update.
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