{"title":"基于时间响应多次采样的混合信号电子微系统模拟部分自测试","authors":"Z. Czaja","doi":"10.1109/I2MTC.2012.6229200","DOIUrl":null,"url":null,"abstract":"A new approach to self-testing of analog parts terminated by ADCs in mixed-signal electronic microsystems controlled by microcontrollers is presented. It bases on a new fault diagnosis method using a transformation of the set of voltage samples of the time response of a tested analog part to a square impulse into identification curves placed in a measurement space. The method can be used for fault detection and single soft fault localization. Modified DFT formulas are used for conversion of the measurement results to the form used by the fault detection and localization algorithm and also for creation of the fault dictionary.","PeriodicalId":387839,"journal":{"name":"2012 IEEE International Instrumentation and Measurement Technology Conference Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2012-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Self-testing of analog parts of mixed-signal electronic microsystems based on multiple sampling of time responses\",\"authors\":\"Z. Czaja\",\"doi\":\"10.1109/I2MTC.2012.6229200\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new approach to self-testing of analog parts terminated by ADCs in mixed-signal electronic microsystems controlled by microcontrollers is presented. It bases on a new fault diagnosis method using a transformation of the set of voltage samples of the time response of a tested analog part to a square impulse into identification curves placed in a measurement space. The method can be used for fault detection and single soft fault localization. Modified DFT formulas are used for conversion of the measurement results to the form used by the fault detection and localization algorithm and also for creation of the fault dictionary.\",\"PeriodicalId\":387839,\"journal\":{\"name\":\"2012 IEEE International Instrumentation and Measurement Technology Conference Proceedings\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-05-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE International Instrumentation and Measurement Technology Conference Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/I2MTC.2012.6229200\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE International Instrumentation and Measurement Technology Conference Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/I2MTC.2012.6229200","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Self-testing of analog parts of mixed-signal electronic microsystems based on multiple sampling of time responses
A new approach to self-testing of analog parts terminated by ADCs in mixed-signal electronic microsystems controlled by microcontrollers is presented. It bases on a new fault diagnosis method using a transformation of the set of voltage samples of the time response of a tested analog part to a square impulse into identification curves placed in a measurement space. The method can be used for fault detection and single soft fault localization. Modified DFT formulas are used for conversion of the measurement results to the form used by the fault detection and localization algorithm and also for creation of the fault dictionary.