{"title":"静电蠕动胶体微泵的数值研究","authors":"N. Quddus, Subir Bhattacharjee, W. Moussa","doi":"10.1109/ICMENS.2004.17","DOIUrl":null,"url":null,"abstract":"An electrostatically driven peristaltic micropump is presented in this paper. A colloidal particle suspended in an electrolyte inside a charged cylindrical capillary will experience an electrical double layer force due to the charged capillary wall. Perturbations in the geometry of the capillary wall result in modification of the electrical force on the particle. If moving these perturbations of the capillary wall along its axis can set up a peristaltic motion of the capillary wall, it will drag the colloidal particle along the capillary. This type of motion can be employed to develop a microfluidic pumping device. This article describes a finite element simulation procedure employed to model such a device.","PeriodicalId":344661,"journal":{"name":"2004 International Conference on MEMS, NANO and Smart Systems (ICMENS'04)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-08-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Numerical Investigation of an Electrostatic-Peristaltic Colloidal Micro Pump\",\"authors\":\"N. Quddus, Subir Bhattacharjee, W. Moussa\",\"doi\":\"10.1109/ICMENS.2004.17\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An electrostatically driven peristaltic micropump is presented in this paper. A colloidal particle suspended in an electrolyte inside a charged cylindrical capillary will experience an electrical double layer force due to the charged capillary wall. Perturbations in the geometry of the capillary wall result in modification of the electrical force on the particle. If moving these perturbations of the capillary wall along its axis can set up a peristaltic motion of the capillary wall, it will drag the colloidal particle along the capillary. This type of motion can be employed to develop a microfluidic pumping device. This article describes a finite element simulation procedure employed to model such a device.\",\"PeriodicalId\":344661,\"journal\":{\"name\":\"2004 International Conference on MEMS, NANO and Smart Systems (ICMENS'04)\",\"volume\":\"39 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-08-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2004 International Conference on MEMS, NANO and Smart Systems (ICMENS'04)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMENS.2004.17\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 International Conference on MEMS, NANO and Smart Systems (ICMENS'04)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMENS.2004.17","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Numerical Investigation of an Electrostatic-Peristaltic Colloidal Micro Pump
An electrostatically driven peristaltic micropump is presented in this paper. A colloidal particle suspended in an electrolyte inside a charged cylindrical capillary will experience an electrical double layer force due to the charged capillary wall. Perturbations in the geometry of the capillary wall result in modification of the electrical force on the particle. If moving these perturbations of the capillary wall along its axis can set up a peristaltic motion of the capillary wall, it will drag the colloidal particle along the capillary. This type of motion can be employed to develop a microfluidic pumping device. This article describes a finite element simulation procedure employed to model such a device.