DI2S提高了X波段比较的分辨率

D. Calabrese, V. Grimani, Pasquale Salemme
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引用次数: 4

摘要

SAR系统的主要制约因素之一是天线尺寸与方位分辨率之间的关系。最小带图分辨率通常固定在天线物理尺寸或等效尺寸的一半。通过在分时使用SAR,正在申请专利的离散阶跃条带(DI2S)技术允许获取不同的条带图像,以增加方位角分辨率或拥有多图像系统,而无需增加接收器数量或划分天线。波束破坏技术也可以用来提高方位角分辨率。在本文中,DI2S技术用于提高分辨率将说明比较两种技术在使用同一X波段SAR系统可实现的性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
DI2S improved resolution vs spoiling for X band comparison
One of the major constraints of the SAR system is the relation between the antenna dimension and the azimuth resolution. The minimum Stripmap resolution is traditionally fixed at half of the antenna physical or equivalent dimension. By using a SAR in time sharing, the Discrete Stepped Strip (DI2S) technique, patent pending, allows the acquisition of different strip images either to increase azimuth resolution or to have a multi-image system, without increasing the number of receivers or partitioning the antenna. The beam spoiling technique can also be used to improve the azimuth resolution. In this paper the DI2S technique for the improved resolution will be illustrated comparing the achievable performance of the two techniques by using the same X band SAR system.
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