一种新型的InP和Si细胞蚀刻模拟器

H. Wehmann, M. Chahoud, A. Schlachetzki
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引用次数: 0

摘要

. 提出了一种结合几何模型和元胞模型优点的简单蚀刻模拟器。模拟器是基于晶体的单元表示。根据实验确定的蚀刻速率,蚀刻前沿的细胞被确定地移除或保留在晶体中。我们比较了文献中蚀刻在HBr和Si结构中的InP图案与模拟结果。虽然在模拟中只考虑了低索引平面,但在复杂结构中出现了高索引平面。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A new cellular etching-simulator for InP and Si
. A simple etching simulator is presented that combines the advantages of geometrical and cellular models. The simulator is based on a cell representation of the crystal. The cells at the etching front are deterministically removed or remain in the crystal depending on the experimentally determined etching rates. We compare InP patterns etched in HBr and Si structures from the literature with simulated results. Although in the simulation only low indexed planes were taken into account higher index planes emerge at complex structures.
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