{"title":"一种新型的InP和Si细胞蚀刻模拟器","authors":"H. Wehmann, M. Chahoud, A. Schlachetzki","doi":"10.1109/ESSDERC.1997.194470","DOIUrl":null,"url":null,"abstract":". A simple etching simulator is presented that combines the advantages of geometrical and cellular models. The simulator is based on a cell representation of the crystal. The cells at the etching front are deterministically removed or remain in the crystal depending on the experimentally determined etching rates. We compare InP patterns etched in HBr and Si structures from the literature with simulated results. Although in the simulation only low indexed planes were taken into account higher index planes emerge at complex structures.","PeriodicalId":424167,"journal":{"name":"27th European Solid-State Device Research Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A new cellular etching-simulator for InP and Si\",\"authors\":\"H. Wehmann, M. Chahoud, A. Schlachetzki\",\"doi\":\"10.1109/ESSDERC.1997.194470\",\"DOIUrl\":null,\"url\":null,\"abstract\":\". A simple etching simulator is presented that combines the advantages of geometrical and cellular models. The simulator is based on a cell representation of the crystal. The cells at the etching front are deterministically removed or remain in the crystal depending on the experimentally determined etching rates. We compare InP patterns etched in HBr and Si structures from the literature with simulated results. Although in the simulation only low indexed planes were taken into account higher index planes emerge at complex structures.\",\"PeriodicalId\":424167,\"journal\":{\"name\":\"27th European Solid-State Device Research Conference\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-09-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"27th European Solid-State Device Research Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESSDERC.1997.194470\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"27th European Solid-State Device Research Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSDERC.1997.194470","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
. A simple etching simulator is presented that combines the advantages of geometrical and cellular models. The simulator is based on a cell representation of the crystal. The cells at the etching front are deterministically removed or remain in the crystal depending on the experimentally determined etching rates. We compare InP patterns etched in HBr and Si structures from the literature with simulated results. Although in the simulation only low indexed planes were taken into account higher index planes emerge at complex structures.