{"title":"衍射板和散射板干涉测量法","authors":"E. W. Cross","doi":"10.1364/oft.1980.ffa2","DOIUrl":null,"url":null,"abstract":"Interferometry has gained general acceptance as the most credible single test means for the optical system or component whose optical path difference (OPD) must be a few wavelengths of light or less. The optical shop must be capable of delivering not only the optic that the customer ordered, but also an interferogram demonstrating the optic's quality.","PeriodicalId":170034,"journal":{"name":"Workshop on Optical Fabrication and Testing","volume":"2004 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Interferometry By Diffraction Plate and Scatter-Plate\",\"authors\":\"E. W. Cross\",\"doi\":\"10.1364/oft.1980.ffa2\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Interferometry has gained general acceptance as the most credible single test means for the optical system or component whose optical path difference (OPD) must be a few wavelengths of light or less. The optical shop must be capable of delivering not only the optic that the customer ordered, but also an interferogram demonstrating the optic's quality.\",\"PeriodicalId\":170034,\"journal\":{\"name\":\"Workshop on Optical Fabrication and Testing\",\"volume\":\"2004 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Workshop on Optical Fabrication and Testing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/oft.1980.ffa2\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Workshop on Optical Fabrication and Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/oft.1980.ffa2","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Interferometry By Diffraction Plate and Scatter-Plate
Interferometry has gained general acceptance as the most credible single test means for the optical system or component whose optical path difference (OPD) must be a few wavelengths of light or less. The optical shop must be capable of delivering not only the optic that the customer ordered, but also an interferogram demonstrating the optic's quality.
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