小直径金属丝极形测量的校正

M. François, J. Sprauel, J. Lebrun, G. Chalant
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引用次数: 1

摘要

为了提高金属丝的机械性能并更好地了解其微观结构,除其他特性外,确定其晶体结构并了解其在制造过程中的变化是必要的。确定试样纹理最常用的技术是通过x射线衍射测量强度极图,然而,在小直径导线的情况下,这种技术不能直接应用。(2)(3)(4)提出了各种半经验或实验方法,但它们要么在假设上缺乏严谨性,要么是在相对较大的直径(> 3mm)上进行的。最近(5)(6)发表的两篇论文在更严格的基础上讨论了这个问题。它们都以样品在给定方向上衍射的强度I(, ' t ')的表达式开始(见图2)。样品是出于强度原因并排放置的导线阵列。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Correction of Pole Figures Measured on Small Diameter MetallicWires
In order to improve the mechanical properties of metallic wires and to achieve better understanding of their microstructure, it is necessary, among Other characteristics, to determine their crystallographic texture and to know how it changes through themanufacturing process. The most commonly used technique to determine the texture of a specimen is to measure intensity pole figures by X-ray diffraction, however, in the case of small diameter wires, this technique cannot be directly applied. Various methods, semi-empirical or experimental, has been proposed 0)(2)(3)(4) but they either lack rigour in their assumptions or are performed on comparatively large diameters (> 3mm). Two papers published recently (5)(6), are dealing with the subject on much more rigorous basis. Both of them start with the expression of the intensity I(,’t’) diffracted by a sample in a given direction (see figure 2). The sample is an array of wires placed side by side for intensity reasons.
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