手持式x射线荧光:作为筛选工具的实际应用,检测电子设备中环境敏感物质的存在

P. Shrivastava, S. O'Connell, A. Whitley
{"title":"手持式x射线荧光:作为筛选工具的实际应用,检测电子设备中环境敏感物质的存在","authors":"P. Shrivastava, S. O'Connell, A. Whitley","doi":"10.1109/ISEE.2005.1437013","DOIUrl":null,"url":null,"abstract":"As the implementation deadlines approach, the electronics industry is focusing significant efforts on compliance with the restriction of hazardous substances (RoHS) directive and the waste electrical and electrical equipment (WEEE) directive. The intent of the EU RoHS Directive (2002/95/EC) is to restrict the use of six substances (lead, mercury, cadmium, hexavalent chromium, PBBs and certain PBDEs) in certain electronic products. There are a number of methods that companies are employing to validate restricted substance compliance within the supply chain, including analytical testing. Normative test methods are needed for the industry to determine the concentrations of the regulated substances in electronic products. This paper presents the practical application of a handheld x-ray fluorescence (XRF) analyzer to estimate the concentration levels of restricted elements such as lead (Pb) and cadmium (Cd) in electronic components. Through this study, handheld XRF was determined to be a suitable screening tool to estimate the concentration of regulated substances in electronic components with some limitations. Being quick and easy-to-use, XRF has shown to be a useful tool for conducting in-house screening analyses of components to reduce testing time and costs.","PeriodicalId":397078,"journal":{"name":"Proceedings of the 2005 IEEE International Symposium on Electronics and the Environment, 2005.","volume":"96 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-05-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Handheld x-ray fluorescence: practical application as a screening tool to detect the presence of environmentally-sensitive substances in electronic equipment\",\"authors\":\"P. Shrivastava, S. O'Connell, A. Whitley\",\"doi\":\"10.1109/ISEE.2005.1437013\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As the implementation deadlines approach, the electronics industry is focusing significant efforts on compliance with the restriction of hazardous substances (RoHS) directive and the waste electrical and electrical equipment (WEEE) directive. The intent of the EU RoHS Directive (2002/95/EC) is to restrict the use of six substances (lead, mercury, cadmium, hexavalent chromium, PBBs and certain PBDEs) in certain electronic products. There are a number of methods that companies are employing to validate restricted substance compliance within the supply chain, including analytical testing. Normative test methods are needed for the industry to determine the concentrations of the regulated substances in electronic products. This paper presents the practical application of a handheld x-ray fluorescence (XRF) analyzer to estimate the concentration levels of restricted elements such as lead (Pb) and cadmium (Cd) in electronic components. Through this study, handheld XRF was determined to be a suitable screening tool to estimate the concentration of regulated substances in electronic components with some limitations. Being quick and easy-to-use, XRF has shown to be a useful tool for conducting in-house screening analyses of components to reduce testing time and costs.\",\"PeriodicalId\":397078,\"journal\":{\"name\":\"Proceedings of the 2005 IEEE International Symposium on Electronics and the Environment, 2005.\",\"volume\":\"96 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-05-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 2005 IEEE International Symposium on Electronics and the Environment, 2005.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEE.2005.1437013\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2005 IEEE International Symposium on Electronics and the Environment, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEE.2005.1437013","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12

摘要

随着实施期限的临近,电子行业正集中精力遵守有害物质限制(RoHS)指令和废弃电气设备(WEEE)指令。欧盟RoHS指令(2002/95/EC)的目的是限制六种物质(铅、汞、镉、六价铬、多溴联苯和某些多溴二苯醚)在某些电子产品中的使用。公司正在采用许多方法来验证供应链中限制物质的合规性,包括分析测试。行业需要规范的测试方法来确定电子产品中受管制物质的浓度。本文介绍了手持式x射线荧光(XRF)分析仪的实际应用,以估计电子元件中铅(Pb)和镉(Cd)等限制元素的浓度水平。通过本研究,确定手持式XRF是一种合适的筛选工具,用于估计电子元件中受管制物质的浓度,但存在一定的局限性。XRF快速且易于使用,已被证明是进行内部组件筛选分析的有用工具,可减少测试时间和成本。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Handheld x-ray fluorescence: practical application as a screening tool to detect the presence of environmentally-sensitive substances in electronic equipment
As the implementation deadlines approach, the electronics industry is focusing significant efforts on compliance with the restriction of hazardous substances (RoHS) directive and the waste electrical and electrical equipment (WEEE) directive. The intent of the EU RoHS Directive (2002/95/EC) is to restrict the use of six substances (lead, mercury, cadmium, hexavalent chromium, PBBs and certain PBDEs) in certain electronic products. There are a number of methods that companies are employing to validate restricted substance compliance within the supply chain, including analytical testing. Normative test methods are needed for the industry to determine the concentrations of the regulated substances in electronic products. This paper presents the practical application of a handheld x-ray fluorescence (XRF) analyzer to estimate the concentration levels of restricted elements such as lead (Pb) and cadmium (Cd) in electronic components. Through this study, handheld XRF was determined to be a suitable screening tool to estimate the concentration of regulated substances in electronic components with some limitations. Being quick and easy-to-use, XRF has shown to be a useful tool for conducting in-house screening analyses of components to reduce testing time and costs.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信