{"title":"一种设计在线可测试可逆电路的简单方法","authors":"N. M. Nayeem, J. Rice","doi":"10.1109/PACRIM.2011.6032872","DOIUrl":null,"url":null,"abstract":"This paper presents a simple technique to convert an ESOP-based reversible circuit into an online testable circuit. The technique does not require redesigning the whole circuit for integrating the testability feature, and no new garbage outputs are produced other than the garbage outputs needed for the ESOP-circuit. With a little extra hardware cost, the resultant circuit can detect online any single-bit errors. Experimental results show that the proposed technique can achieve an improvement of up to 58% in quantum cost and 99% in garbage outputs in average, compared to the previous work.","PeriodicalId":236844,"journal":{"name":"Proceedings of 2011 IEEE Pacific Rim Conference on Communications, Computers and Signal Processing","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":"{\"title\":\"A simple approach for designing online testable reversible circuits\",\"authors\":\"N. M. Nayeem, J. Rice\",\"doi\":\"10.1109/PACRIM.2011.6032872\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a simple technique to convert an ESOP-based reversible circuit into an online testable circuit. The technique does not require redesigning the whole circuit for integrating the testability feature, and no new garbage outputs are produced other than the garbage outputs needed for the ESOP-circuit. With a little extra hardware cost, the resultant circuit can detect online any single-bit errors. Experimental results show that the proposed technique can achieve an improvement of up to 58% in quantum cost and 99% in garbage outputs in average, compared to the previous work.\",\"PeriodicalId\":236844,\"journal\":{\"name\":\"Proceedings of 2011 IEEE Pacific Rim Conference on Communications, Computers and Signal Processing\",\"volume\":\"45 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-10-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"20\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 2011 IEEE Pacific Rim Conference on Communications, Computers and Signal Processing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PACRIM.2011.6032872\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 2011 IEEE Pacific Rim Conference on Communications, Computers and Signal Processing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PACRIM.2011.6032872","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A simple approach for designing online testable reversible circuits
This paper presents a simple technique to convert an ESOP-based reversible circuit into an online testable circuit. The technique does not require redesigning the whole circuit for integrating the testability feature, and no new garbage outputs are produced other than the garbage outputs needed for the ESOP-circuit. With a little extra hardware cost, the resultant circuit can detect online any single-bit errors. Experimental results show that the proposed technique can achieve an improvement of up to 58% in quantum cost and 99% in garbage outputs in average, compared to the previous work.