si掺杂GaN(0001)表面原生点缺陷的电子结构和光学性质

Y. Ju, Lei Liu, F. Lu
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摘要

本文基于密度泛函理论的第一性原理,研究了n-GaN(0001)表面天然点缺陷的形成能、原子结构、电子结构和光学性质。结果发现,n型氮化镓表面不易存在该缺陷,且极易出现该缺陷。替换缺陷抛射、间隙缺陷抛射和单Ga空位使导带下降,费米能级更深程度地进入导带。然而,随着Ga空位的增加,价带和导带同时上移,表现出p型特征,降低了表面的n型电导率。n空位使导带向上移动,降低了n型金属的导电性。研究还发现,表面光子吸附的减少会影响表面的光发射,这对具有n-GaN和金属触点的光电器件是不利的。本研究表明,n型GaN薄膜的点缺陷、点缺陷、点缺陷均增加了n型GaN薄膜的掺杂难度,对制备具有n-GaN和金属触点的高性能光电器件具有一定的价值。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Electronic structure and optical properties of native point defects on Si-doped GaN (0001) surface
This paper investigates the formation energy, atomic structure, electronic structure and optical properties of native point defects on n-GaN (0001) surface based on the first-principles of the density functional theory. The results find that the 𝑉𝑁 is not easy to exist and the 𝑉𝐺𝑎, 𝑁𝐺𝑎 or 𝑁𝑖 defects are most likely to appear on the n-type GaN surface. The substitutional defect 𝑁𝐺𝑎 , the interstitial defect 𝑁𝑖 and the single Ga vacancy cause the conduction band to drop and the Fermi level to enter the conduction band in a deeper extent. However, both the valence band and the conduction band move up at the same time with the increase of Ga vacancies, exhibiting p-type characteristics and reducing the n-type conductivity of the surface. The N-vacancy makes the conduction band shift upwards, which reduces the n-type metal conductivity. It is also found that the reduction of photon adsorption on the surface affects the photo-emission of the surface, which is detrimental to the optoelectronic devices with n-GaN and metal contacts. This study shows that 𝑉𝐺𝑎, 𝑁𝐺𝑎 and 𝑁𝑖 native point defects all increase the doping difficulty of n-type GaN films and have a certain value for the fabrication of high-performance optoelectronic devices with n-GaN and metal contacts.
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