微波同轴谐振器滤波器损耗机制的测量

S. Maas, P. Meyer, P. V. D. Walt
{"title":"微波同轴谐振器滤波器损耗机制的测量","authors":"S. Maas, P. Meyer, P. V. D. Walt","doi":"10.1109/AFRCON.2013.6757636","DOIUrl":null,"url":null,"abstract":"Various loss mechanisms in microwave coaxial resonators are investigated through measurement. The effects of structure, manufacturing techniques, polishing techniques and plating on the Q-factor are compared for an S-band resonator. It is experimentally established that wire-cutting followed by silver plating results in the highest Q-values, which are also comparable with simulation results.","PeriodicalId":159306,"journal":{"name":"2013 Africon","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Measurement of loss mechanisms in microwave coaxial resonator filters\",\"authors\":\"S. Maas, P. Meyer, P. V. D. Walt\",\"doi\":\"10.1109/AFRCON.2013.6757636\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Various loss mechanisms in microwave coaxial resonators are investigated through measurement. The effects of structure, manufacturing techniques, polishing techniques and plating on the Q-factor are compared for an S-band resonator. It is experimentally established that wire-cutting followed by silver plating results in the highest Q-values, which are also comparable with simulation results.\",\"PeriodicalId\":159306,\"journal\":{\"name\":\"2013 Africon\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 Africon\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AFRCON.2013.6757636\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 Africon","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AFRCON.2013.6757636","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

通过测量研究了微波同轴谐振器的各种损耗机理。比较了s波段谐振器的结构、制造工艺、抛光工艺和镀层对q因子的影响。实验结果表明,线切割后镀银的q值最高,与模拟结果相当。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Measurement of loss mechanisms in microwave coaxial resonator filters
Various loss mechanisms in microwave coaxial resonators are investigated through measurement. The effects of structure, manufacturing techniques, polishing techniques and plating on the Q-factor are compared for an S-band resonator. It is experimentally established that wire-cutting followed by silver plating results in the highest Q-values, which are also comparable with simulation results.
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