通过MIL-STD-285和其他方法预测大型外壳中孔的屏蔽效果

L. Hoeft, T. Salas, J. Hofstra, W. Prather
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引用次数: 8

摘要

将极化率理论应用于具有明确孔径的导电屏蔽体屏蔽效能的预测问题。屏蔽效能由MIL-STD-285(有和没有屏蔽的情况下在规定点上的磁场之比)和屏蔽内外磁场之比来定义。相对简单的关系,当孔径是电小,屏蔽表现得像一个平面导电片。这些关系与测量值一致,并允许使用校准孔径来建立屏蔽有效性测量的可信度。结果表明,屏蔽效能和表面磁场衰减都是测量点与屏蔽点之间距离的强函数。因此,两者都不是本征电磁参数。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Predicted shielding effectiveness of apertures in large enclosures as measured by MIL-STD-285 and other methods
Polarizability theory was applied to the problem of predicting the shielding effectiveness of a conductive shield with a well-defined aperture. Shielding effectiveness was defined by both MIL-STD-285 (ratio of the fields at a prescribed point with and without the shield in place) and the ratio of the magnetic field outside and inside of a shield. Relatively simple relationships were derived when the aperture was electrically small and the shield behaved like a plane conducting sheet. These relationships were consistent with measured values, and allow calibration apertures to be used to establish the credibility of shielding effectiveness measurements. It is noted that shielding effectiveness and surface magnetic-field attenuation are both strong functions of the distance between the measurement location and the shield. Thus, both are not intrinsic electromagnetic parameters.<>
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